Proceedings of 1995 IEEE MTT-S International Microwave Symposium
DOI: 10.1109/mwsym.1995.406008
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RF-stressed life test of pseudomorphic InGaAs power HEMT MMIC at 44 GHz

C.H. Chen
1
,
G. Zell
2
,
Yuta Saito
3
et al.
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Cited by 6 publications
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