2021
DOI: 10.1016/j.solmat.2021.111388
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Robust passivation of CdSeTe based solar cells using reactively sputtered magnesium zinc oxide

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Cited by 14 publications
(8 citation statements)
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“…On the other hand, all target cells show a clear improvement in V OC s, FFs, and, therefore, PCEs. The V OC (0.863 V) of the champion device is as high as that reported for the champion Cd(Se,Te) solar cell using ZMO buffer layer 12 , 36 , 46 . It is noted that the target solar cells show significantly increased reproducibility as compared with Cd(Se,Te) solar cells using ZMO buffer layers (Supplementary Fig.…”
Section: Resultssupporting
confidence: 46%
“…On the other hand, all target cells show a clear improvement in V OC s, FFs, and, therefore, PCEs. The V OC (0.863 V) of the champion device is as high as that reported for the champion Cd(Se,Te) solar cell using ZMO buffer layer 12 , 36 , 46 . It is noted that the target solar cells show significantly increased reproducibility as compared with Cd(Se,Te) solar cells using ZMO buffer layers (Supplementary Fig.…”
Section: Resultssupporting
confidence: 46%
“…Namely, when MgZnO is deposited via reactive sputtering using Mg and Zn targets in a high-oxygen ambient, MgZnO was found to be stable to device processing. [36,89] When the MgZnO was sputtered from hot pressed mixed powder (MgO and ZnO) targets in a low-oxygen ambient, however, Mg concentration, and therefore MgZnO bandgap, was found to decrease after processing and/or annealing. [88] In addition, there was evidence for CdSe x Te 1Àx oxidation from the MgZnO, which was not observed in MgZnO/CdTe devices.…”
Section: Science Of Buried Interfaces In Cdtementioning
confidence: 99%
“…In the case of MgZnO/CdSe x Te 1− x devices, no interdiffusion of the MgZnO and CdSe x Te 1− x has been observed, [ 88,89 ] but the MgZnO deposition conditions do appear to affect its stability. Namely, when MgZnO is deposited via reactive sputtering using Mg and Zn targets in a high‐oxygen ambient, MgZnO was found to be stable to device processing.…”
Section: Science Of Buried Interfaces In Cdtementioning
confidence: 99%
“…Recent modeling has shown that band and Fermi level alignment between the front interface emitter and the absorber is necessary for low front interfacial recombination currents and high efficiency. , When the conduction band and Fermi level of the emitter are relatively high in energy as compared to those of the absorber, the conduction band offset (CBO) is assigned to be positive and the band bending that drives the majority carrier holes away from the front interface is increased in the absorber. To date, only one buffer material system, consisting of combinations of MgO and ZnO (i.e., Mg x Zn 1– x O), has been communicated in the literature with the ability to tune the CBO and reduce front interface recombination to achieve efficiencies as high as 19.5% …”
mentioning
confidence: 99%
“…To date, only one buffer material system, consisting of combinations of MgO and ZnO (i.e., Mg x Zn 1−x O), has been communicated in the literature with the ability to tune the CBO and reduce front interface recombination to achieve efficiencies as high as 19.5%. 13 A recent modeling paper by Dive et al suggested that the materials in the In 2 O 3 −Ga 2 O 3 system could possibly be a second potential candidate materials system for CdTe emitter fabrication. 14 Although the component oxides, In 2 O 3 and Ga 2 O 3 , have bandgaps between 2.9 and 3.6 eV 15−18 Here, we present an experimental examination of IGO materials for use as emitters in CdTe-based solar cells.…”
mentioning
confidence: 99%