Role of a covalent bonding interaction in noncontact-mode atomic-force microscopy on Si(111)7×7

Uchihashi, Takayuki; Sugawara, Yasuhiro; Tsukamoto, Toyohisa; Ohta, Makoto; Morita, Seizo; Suzuki, Mineharu

doi:10.1103/physrevb.56.9834

Cited by 139 publications

(62 citation statements)

References 27 publications

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“…15 This is believed to be the reason why stable, reproducible atomic images have been obtained since the employment of PLO in NC AFM systems. 18,19 This is also consistent with the observation by Reichling et al of a resolution difference in imaging CaF 2 ͑111͒ using PLO and DRO systems. 20 The author wishes to thank Dr. Scott Perry for support of the work, Dr. Hyun I. Kim for assistance with construction of the electronics described, and Dr. Antonio Oliver for his careful reading of the manuscript and correcting errors during preparation.…”

Section: Fig 2 (A)supporting

confidence: 81%

Direct comparison between phase locked oscillator and direct resonance oscillator in the noncontact atomic force microscopy under ultrahigh vacuum

Kim

2004

Review of Scientific Instruments

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I have demonstrated the advantage of the phase locked oscillator (PLO) over the conventional direct resonance oscillator (DRO) in noncontact mode atomic force microscopy (AFM) under ultrahigh vacuum. Direct comparison between PLO and DRO has been made in terms of background noise level, temporal response, and stability. Compared to the DRO method without phase coherence, the experimental results show that the PLO method is more effective in reducing the noise level and enhancing the stability over all force regimes in UHV noncontact AFM. The noise reduction and stability enhancement in PLO indicate the important role of the phase coherent effect in improving the capability of noncontact imaging in UHV.

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Section: Fig 2 (A)supporting

confidence: 81%

Direct comparison between phase locked oscillator and direct resonance oscillator in the noncontact atomic force microscopy under ultrahigh vacuum

Kim

2004

Review of Scientific Instruments

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“…The deformation of tips is consistent with the experimental results of destruction of diamond tips on contact-mode probing of Si surfaces. 22 The depth dependence of the F/A ratio in Fig. 4 has a maximum around the depth of Ϫ0.6-0.2 Å.…”

Section: Discussionmentioning

confidence: 99%

Nanoindentation of silicon surfaces: Molecular-dynamics simulations of atomic force microscopy

et al. 2000

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We investigate the atomic-scale details of atomic force microscopy through a quasistatic molecular dynamics simulation together with a density-functional-based tight-binding method. The changes in the AFM tip shape, the size of the tip-sample contact area, as well as the microscopic hardness and Young's moduli of silicon ͕111͖,͕110͖,͕100͖ surfaces are studied. Furthermore, the effects of hydrogen termination of the surface and of subsurface vacancies on hardness and Young's modulus are discussed.

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“…Typical atomically resolved SFM images of the Si͑111͒ 7ϫ7 surface reveal one corner hole and 12 protruding adatoms in the diamond-shaped reconstructed surface unit cell with corrugation heights of 1-2 Å. [5][6][7] In more recent work the six rest atoms of the unit cell have also been resolved as additional local maxima, approximately 0.6 Å below the adatoms. [8][9][10] Such atomic scale contrast has been attributed to a dangling bond at the tip apex interacting with nearby dangling bonds on the surface adatoms and rest atoms.…”

Section: Introductionmentioning

confidence: 95%

Short-range electrostatic interactions in atomic-resolution scanning force microscopy on theSi(111)7×7surface

et al. 2003

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A low-temperature scanning force microscope ͑SFM͒ operating in ultrahigh vacuum was used to study the interaction between a sharp but unreactive oxidized silicon tip and a Si͑111͒ 7ϫ7 surface. Weakly corrugated but, nevertheless, atomically resolved images were obtained over a relatively large range of tip-sample distance. The measured short-range interaction potential and image contrast can be explained by an electrostatic interaction that results from a dipole moment induced in the tip by the distribution of electronic charge among the dangling bonds on the surface. The experiments presented here demonstrate the potential of SFM to quantitatively map even weak, physical interactions with atomic scale resolution. Such experiments should lead to a better understanding of surface reactivity and local charge-transfer effects induced by adsorbates or defects at surfaces.

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Role of a covalent bonding interaction in noncontact-mode atomic-force microscopy on Si(111)7×7

Cited by 139 publications

References 27 publications

Direct comparison between phase locked oscillator and direct resonance oscillator in the noncontact atomic force microscopy under ultrahigh vacuum

Direct comparison between phase locked oscillator and direct resonance oscillator in the noncontact atomic force microscopy under ultrahigh vacuum

Nanoindentation of silicon surfaces: Molecular-dynamics simulations of atomic force microscopy

Short-range electrostatic interactions in atomic-resolution scanning force microscopy on theSi(111)7×7surface

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