Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi mathvariant="normal">Si</mml:mi><mml:mn /><mml:mo>(</mml:mo><mml:mn>111</mml:mn><mml:mo>)</mml:mo><mml:mn>7</mml:mn><mml:mo>×</mml:mo><mml:mn>7</mml:mn></mml:math>surface

Lantz, Mark A.; Hug, Hans J.; Hoffmann, R.; Martin, S.; Baratoff, A.; Güntherodt, H.‐J.

doi:10.1103/physrevb.68.035324

Cited by 27 publications

(21 citation statements)

References 22 publications

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“…However, also for larger tip-sample separations, atomic scale contrast has been observed on Si(111)7x7 Ref. [9]. In this work, the authors use a non-reactive oxidized silicon tip and explain that the tip-sample interaction is dominated by the dipole moment induced in the tip due to the surface charge distribution and not by covalent bonding.…”

Section: Introductionmentioning

confidence: 96%

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

2011

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We discuss the influence of short-range electrostatic forces, so called dipolar forces, between the tip of an atomic force microscope (AFM) and a surface carrying charged adatoms. Dipolar forces are of microscopic character and have their origin in the polarizability of the foremost atoms on tip and surface. In most experiments performed by non-contact AFM, other forces such as binding forces dominate the interaction. However, in the experiments presented by Gross et al. [Science 324, 1428[Science 324, (2009, where the charge state of individual gold atoms adsorbed on a thin dielectric layer was determined, binding forces are negligible as the tip-sample distance is relatively large.We develop a model which mimics the experimental tip-sample geometry of the aforementioned experiments. The model includes van der Waals and long-range electrostatic interactions, as well as the short-range electrostatic interaction based on the self-consistent description of electronic polarization effects on neutral and charged adatoms. The model is based on a calculation of the electrostatic energy of the tip-sample geometry.Our calculations of non-contact AFM imaging as well as of bias spectroscopic curves are in good agreement with the experimental ones presented by Gross et al. It is demonstrated that the short-range dipolar force is mainly responsible for the contrast observed in topography imaging above charged species. However, it is the long-range capacitive force which is responsible for the detection of the charge state in bias spectroscopy. We discuss implications of our findings on future experiments which aim to detect single charges by means of Kelvin probe force microscopy.

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Section: Introductionmentioning

confidence: 96%

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

2011

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“…[1][2][3] The method has first been demonstrated on the ͑111͒ surface of the semiconductor Si, 4,5 and has then been applied to ionic crystalline 6,7 and oxide surfaces. 8,9 It has been shown that identification of atomic species on semiconducting surfaces is possible through a careful study of the force as a function of tip-sample distance.…”

Section: Introductionmentioning

confidence: 99%

Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface

et al. 2009

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We compare the three-dimensional force field obtained from frequency-distance measurements above the NaCl͑001͒ surface to atomistic calculations using various tip models. In the experiments, long-range forces cause a total attractive force even on the similarly charged site. Taking force differences between two sites minimizes the influence of such long-range forces. The magnitude of the measured force differences are by a factor of 6.5-10 smaller than the calculated forces. This is an indication that for the particular tip used in this experiment several atoms of the tip interact with the surface atoms at close tip-sample distances. The interaction of these additional atoms with the surface is small at the imaging distance, because symmetric images are obtained. The force distance characteristics resemble those of a negative tip apex ion which could be explained, e.g., by a neutral Si tip.

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“…Silicon tips have been used in several experiments to study alkali halide surfaces [7][8][9][10] or alkali halide thin films on metals [11,12] or molecules on alkali halide surfaces [13,14]. The tips of NC-AFM are often intentionally or spontaneously crashed into the sample during experiments [15]. Theoretical studies suggest that atoms from the sample are transferred onto the tip apex of NCAFMs when in contact with the surface [16].…”

Section: Introductionmentioning

confidence: 99%

Adsorption of small NaCl clusters on surfaces of silicon nanostructures

et al. 2009

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We have studied possible adsorption geometries of neutral NaCl clusters on the disordered surface of a large silicon model tip used in non-contact atomic force microscopy. The minima hopping method was used to determine low energy model tip configurations as well as ground state geometries of isolated NaCl clusters. The combined system was treated with density functional theory. Alkali halides have proven to be strong structure seekers and tend to form highly stable ground state configurations whenever possible. The favored adsorption geometry for four Na and four Cl atoms was found to be an adsorption of four NaCl dimers due to the formation of Cl-Si bonds. However, for larger NaCl clusters, the increasing energy required to dissociate the cluster into NaCl dimers suggests that adsorption of whole clusters in their isolated ground state configuration is preferred.

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Short-range electrostatic interactions in atomic-resolution scanning force microscopy on theSi(111)7×7surface

Cited by 27 publications

References 22 publications

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface

Adsorption of small NaCl clusters on surfaces of silicon nanostructures

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