Role of film thickness on the properties of ZnO thin films grown by sol-gel method

Kumar, Vinod; Singh, Neetu; Mehra, R.M.; Kapoor, Avinashi; Purohit, L.P.; Swart, H.C.

doi:10.1016/j.tsf.2013.05.088

Cited by 175 publications

(71 citation statements)

References 36 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The increase in the intensity of the XRD peaks of thin films reflects that the films are becoming thickerand having bigger crystallite size. Kumar et al [25] and Xu et al [26] also observed the thickness dependence increase in the intensity of XRD pattern. The decrease in breadth attributed to increase in crystallite size and the decrease in lattice strain, which causes an improvement in the crystallinity.…”

Section: Structural Characterizationmentioning

confidence: 87%

Morphological, optical and X-ray photoelectron chemical state shift investigations of ZnO thin films

Jilani

Iqbal

Rafique

et al. 2016

Optik

View full text Add to dashboard Cite

Section: Structural Characterizationmentioning

confidence: 87%

Morphological, optical and X-ray photoelectron chemical state shift investigations of ZnO thin films

Jilani

Iqbal

Rafique

et al. 2016

Optik

View full text Add to dashboard Cite

“…Some researchers have studied the influence of film thickness on surface morphology. 29 They found Ra increased when films became thicker. Considering the thickness information from our RBS results, we find that films at RT and 250 • C obey this conclusion.…”

Section: A Characterization Of Thin Filmsmentioning

confidence: 99%

Suppression effect of silicon (Si) on Er3+ 1.54μm excitation in ZnO thin films

et al. 2016

AIP Advances

View full text Add to dashboard Cite

We have investigated the photoluminescence (PL) characteristics of ZnO:Er thin films on Si (100) single crystal and SiO2-on-silicon (SiO2) substrates, synthesized by radio frequency magnetron sputtering. Rutherford backscattering/channeling spectrometry (RBS), X-ray diffraction (XRD) and atomic force microscope (AFM) were used to analyze the properties of thin films. The diffusion depth profiles of Si were determined by second ion mass spectrometry (SIMS). Infrared spectra were obtained from the spectrometer and related instruments. Compared with the results at room temperature (RT), PL (1.54μm) intensity increased when samples were annealed at 250°C and decreased when at 550°C. A new peak at 1.15μm from silicon (Si) appeared in 550°C samples. The Si dopants in ZnO film, either through the diffusion of Si from the substrate or ambient, directly absorbed the energy of pumping light and resulted in the suppression of Er3+ 1.54μm excitation. Furthermore, the energy transmission efficiency between Si and Er3+ was very low when compared with silicon nanocrystal (Si-NC). Both made the PL (1.54μm) intensity decrease. All the data in experiments proved the negative effects of Si dopants on PL at 1.54μm. And further research is going on.

show abstract

“…Amongst them, ZnO arose as an appropriate matrix for successful attachment of biomolecules [24]. ZnO finds diverse applications in the field of optoelectronics, photovoltaics, sensors, data storage, biochemical/chemical sensors etc [25,26]. Zinc oxide (ZnO) is a semiconductor having wide bandgap of approximately 3.4 eV and possesses an isoelectric point i.e.…”

Section: Introductionmentioning

confidence: 99%

Sensitive optical biosensor based on surface plasmon resonance using ZnO/Au bilayered structure

Paliwal

Gaur²,

Sharma

et al. 2016

Optik

View full text Add to dashboard Cite

Role of film thickness on the properties of ZnO thin films grown by sol-gel method

Cited by 175 publications

References 36 publications

Morphological, optical and X-ray photoelectron chemical state shift investigations of ZnO thin films

Morphological, optical and X-ray photoelectron chemical state shift investigations of ZnO thin films

Suppression effect of silicon (Si) on Er3+ 1.54μm excitation in ZnO thin films

Sensitive optical biosensor based on surface plasmon resonance using ZnO/Au bilayered structure

Contact Info

Product

Resources

About