2011
DOI: 10.1016/j.jpcs.2011.04.007
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Role of growth temperature and oxygen partial pressure on the structural and electrical properties of pulsed laser deposited La1−xSrxnO3−δ thin films

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Cited by 6 publications
(2 citation statements)
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“…Then, we have prepared LCFN thin films by PLD technique, using a target made from this powder. Since film oxygen concentration plays an important role in formation of the micro-structure, surface morphology and especially electronic and ionic conductivity of perovskite materials [17], we explored for an optimum oxygen pressure by which the more electrical conductivity is achieved. X-ray diffraction (XRD), field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) were used as characterization tools.…”
Section: Introductionmentioning
confidence: 99%
“…Then, we have prepared LCFN thin films by PLD technique, using a target made from this powder. Since film oxygen concentration plays an important role in formation of the micro-structure, surface morphology and especially electronic and ionic conductivity of perovskite materials [17], we explored for an optimum oxygen pressure by which the more electrical conductivity is achieved. X-ray diffraction (XRD), field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) were used as characterization tools.…”
Section: Introductionmentioning
confidence: 99%
“…Very few studies discuss morphology control of multi-cationic films, [31][32][33] and fewer still focus on LSMO film morphology control. 34,35 Through our work here, we demonstrate success in achieving high T c films of LSMO with complete morphology control and process reproducibility directly on Si. We quantitatively define separate PLD process parameters regimes to obtain dense and columnar LSMO films on Si, suited for top-down and bottom-up device architectures, respectively.…”
Section: Introductionmentioning
confidence: 81%