2005 IEEE LEOS Annual Meeting Conference Proceedings 2005
DOI: 10.1109/leos.2005.1548344
|View full text |Cite
|
Sign up to set email alerts
|

Role of temperature and gas-chemistry in micro-masking of InP by ICP etching

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
1
0

Year Published

2010
2010
2011
2011

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 3 publications
0
1
0
Order By: Relevance
“…Therefore the formation of the nanowires is a result of a nanoscale self-masking phenomenon and deserves careful analysis. Similar “grassy” phenomena were usually treated as an unwanted side effect, and only recently similar grass structures on silicon have been studied for enhanced optical absorption . InP grass structures were observed when InP substrates were etched by chlorine (Cl 2 )-based gas mixtures, due to the “micromask” effect from indium chloride, a low-volatility reaction product .…”
mentioning
confidence: 99%
“…Therefore the formation of the nanowires is a result of a nanoscale self-masking phenomenon and deserves careful analysis. Similar “grassy” phenomena were usually treated as an unwanted side effect, and only recently similar grass structures on silicon have been studied for enhanced optical absorption . InP grass structures were observed when InP substrates were etched by chlorine (Cl 2 )-based gas mixtures, due to the “micromask” effect from indium chloride, a low-volatility reaction product .…”
mentioning
confidence: 99%