2010
DOI: 10.1007/978-1-4419-6018-4_5
|View full text |Cite
|
Sign up to set email alerts
|

Root Cause and Failure Analysis

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2018
2018
2018
2018

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 19 publications
0
1
0
Order By: Relevance
“…Another community is micro-electronics, including microelectromechanical systems (MEMS) and micro-discharge devices that make electrode size and/or gaps at micro-scale dimensions. Since these systems often require high voltages for actuation (for example, in electrostatic switches in emerging MEMS [3] or usually explored in environments of high voltage, the primary concern is to prevent breakdown and sparking so that the devices can operate safely [4]. This depends strongly on the understanding of breakdown in the electrode's size and gap of micro-scale.…”
Section: Introductionmentioning
confidence: 99%
“…Another community is micro-electronics, including microelectromechanical systems (MEMS) and micro-discharge devices that make electrode size and/or gaps at micro-scale dimensions. Since these systems often require high voltages for actuation (for example, in electrostatic switches in emerging MEMS [3] or usually explored in environments of high voltage, the primary concern is to prevent breakdown and sparking so that the devices can operate safely [4]. This depends strongly on the understanding of breakdown in the electrode's size and gap of micro-scale.…”
Section: Introductionmentioning
confidence: 99%