2023
DOI: 10.1002/app.54042
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Rough FTO electrode interface effect upon ferroelectric switching dynamics in Ag/P(VDF‐HFP)/FTO capacitor structures

Abstract: Rough FTO electrode interface effect upon the characteristic ferroelectric polarization parameters and switching dynamics in Ag/P(VDF‐HFP)/FTO junctions is systematically evaluated by varying electric field amplitude and frequency. Structural and microstructural studies confirm the ferroelectric phase formation of P(VDF‐HFP) on FTO surface. Tilted rectangular P‐E loops have been recorded in the applied fields ranging over 156.25–468.75 MV/m measured between 250 mHz and 5 Hz frequency ranges. Giant saturation o… Show more

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Cited by 2 publications
(2 citation statements)
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“…The tilted loop can be explained by the inhomogeneous and scattering E c of ferroelectric domains in P­(VDF-TrFE-VF) terpolymers . In addition, polarization from conduction at high field and space charge limited current may also contribute to the tilted loops …”
Section: Resultsmentioning
confidence: 98%
See 1 more Smart Citation
“…The tilted loop can be explained by the inhomogeneous and scattering E c of ferroelectric domains in P­(VDF-TrFE-VF) terpolymers . In addition, polarization from conduction at high field and space charge limited current may also contribute to the tilted loops …”
Section: Resultsmentioning
confidence: 98%
“…40 In addition, polarization from conduction at high field and space charge limited current may also contribute to the tilted loops. 41 In general, when being introduced as a chain defect, VF plays a very different, and in many ways an opposite role, compared with the bulky chlorinated monomers such as CFE, CDFE, or CTFE in the terpolymers. Previous studies on the composition-dependence of the ferroelectric properties in P(VDF-TrFE-CDFE) and P(VDF-TrFE-CTFE) terpolymers suggest a progressive transition from normal ferroelectric to relaxor ferroelectric behavior as the CDFE or CTFE molar content increases.…”
Section: Synthesis and Composition Of P(vdf-trfe-vf)smentioning
confidence: 99%