2006
DOI: 10.1016/j.solmat.2006.06.003
|View full text |Cite
|
Sign up to set email alerts
|

Rough ZnO layers by LP-CVD process and their effect in improving performances of amorphous and microcrystalline silicon solar cells

Abstract: Doped ZnO layers deposited by low-pressure chemical vapour deposition technique have been studied for their use as transparent contact layers for thin-film silicon solar cells.Surface roughness of these ZnO layers is related to their light-scattering capability; this is shown to be of prime importance to enhance the current generation in thin-film silicon solar cells. Surface roughness has been tuned over a large range of values, by varying thickness and/or doping concentration of the ZnO layers.A method is pr… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

3
93
0
1

Year Published

2010
2010
2016
2016

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 206 publications
(97 citation statements)
references
References 6 publications
3
93
0
1
Order By: Relevance
“…In our laboratory, mc-Si:H p-i-n solar cells are deposited on glass covered by low pressure chemical vapor deposition zinc oxide (LPCVD ZnO), which possesses a natural texture, with as-grown pyramids at the surface, exhibiting typically a V-shape structure [19,20]. Depending on the transparent conductive oxide (TCO) growth process conditions and on the ''sharpness'' of the V-shapes, such as TCO surface morphology, can lead to severe degradation of the performances of mc-Si:H solar cells, as those are particularly sensitive to cracks that appear in the intrinsic layer because of the V-shape.…”
Section: Introductionmentioning
confidence: 99%
“…In our laboratory, mc-Si:H p-i-n solar cells are deposited on glass covered by low pressure chemical vapor deposition zinc oxide (LPCVD ZnO), which possesses a natural texture, with as-grown pyramids at the surface, exhibiting typically a V-shape structure [19,20]. Depending on the transparent conductive oxide (TCO) growth process conditions and on the ''sharpness'' of the V-shapes, such as TCO surface morphology, can lead to severe degradation of the performances of mc-Si:H solar cells, as those are particularly sensitive to cracks that appear in the intrinsic layer because of the V-shape.…”
Section: Introductionmentioning
confidence: 99%
“…In order to keep the same morphology for both types of front electrodes, a stack of two layers is used in the n-i-d case. A 7-µm-thick layer is first deposited on glass and flattened by chemo-mechanical polishing (CMP) to erase the very large pyramidal features that naturally form on its surface during layer growth [22]. This polishing is made by immersing the sample in a diluted suspension of silica nanoparticles as typically used for CMP, and scanning the surface with a felt-covered drill-head.…”
Section: Methodsmentioning
confidence: 99%
“…To inhibit epitaxial growth on this polished surface, an ultra-thin (<3 nm) n-doped µc-Si:H layer is subsequently deposited; a n-i-d ZnO film is then deposited on top, with thickness adjusted to match the surface morphology of the 2-µm-thick doped layer. Due to a reduction of the lateral growth rate of the grains when LPCVD ZnO is doped [22], this rough n-i-d layer is only 1.6-µm-thick.…”
Section: Methodsmentioning
confidence: 99%
“…In fact, the Std layer suffers from strong parasitic light absorption (FCA) due to the high doping level. In addition, the high doping produces in the ZnO smaller grains than in the n-i-d, which decreases the light scattering at the ZnO-Si interface [12].Also, it can be seen that the cell deposited on the n-i-d_pH2 electrode generates slightly more current in the blue part of the spectrum than on the n-i-d non-treated ZnO, thanks to the widening of its band gap, as discussed in previous section. Actually, this approach should be especially advantageous in the case of tandem amorphous/ microcrystalline μc-Si:H (micromorph) TF Si solar cells, where the current generation in the bottom μc-Si:H cell is crucial [13].…”
Section: Hydrogen Plasma Post-treatment On Front and Back Electrodesmentioning
confidence: 99%