2020 IEEE International Test Conference (ITC) 2020
DOI: 10.1109/itc44778.2020.9325240
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SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts

Sujay Pandey
1
,
Zhiwei Liao
2
,
Shreyas Nandi
3
et al.
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Cited by 5 publications
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