“…EBSD could be used, for example, to measure the orientation between nitride thin films and their substrates. Nitride thin films are predominantly grown on sapphire substrates with α‐SiC the next most common substrate, but thin films have been grown on MgO, ZnO, TiO 2 , LiAlO 2 , LiGaO 2 , MgAl 2 O 4 , InP, W, GaP and Si (Strite & Morkoç, 1992; Hellman et al. , 1996; Lee et al.…”