2005
DOI: 10.1002/9780470866795
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Scanning Auger Electron Microscopy

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Cited by 6 publications
(1 citation statement)
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“…AES provides higher lateral resolution measurement when the surface distribution of the elements is less than a micrometer scale. 15 To detect trace amount of contaminants on a surface this might be useful. The AES peaks are superimposed on an imported background of different types of secondary electrons.…”
Section: Methodsmentioning
confidence: 99%
“…AES provides higher lateral resolution measurement when the surface distribution of the elements is less than a micrometer scale. 15 To detect trace amount of contaminants on a surface this might be useful. The AES peaks are superimposed on an imported background of different types of secondary electrons.…”
Section: Methodsmentioning
confidence: 99%