Scanning Electron Microscopy/1972: Proceedings of the 5th Annual Scanning Electron Microscope Symposium and Workshop on Biological Specimen Preparation for Scanning Electron Microscopy

Corliss, John O.; Johari, O.; Corvin, I.

doi:10.2307/3224939

Transactions of the American Microscopical Society

1973

DOI: 10.2307/3224939

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Scanning Electron Microscopy/1972: Proceedings of the 5th Annual Scanning Electron Microscope Symposium and Workshop on Biological Specimen Preparation for Scanning Electron Microscopy

John O. Corliss¹,

O. Johari²,

I. Corvin³

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Visualization and Quantification of Plastic Strain Induced by Indentation in Polycrystalline Nickel

Kaboli¹,

Demers²,

Brodusch³

et al. 2013

Microsc Microanal

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A plastic strain field causes lattice distortion through introduction of dislocations into the crystal [1]. In a scanning electron microscope (SEM), near surface plastic strain fields can be studied using electron channeling contrast imaging (ECCI) and electron backscattered diffraction (EBSD) techniques. In ECCI, plastic strain fields can be visualized through channeling contrast variations due to crystallographic misorientations [2]. In EBSD, plastic strain fields are quantified since presence of plastic strain degrades the electron backscattered diffraction pattern quality [1]. In this study, propagation of indentationinduced plastic zone underneath the surface and in-situ dislocation density measurements were studied using ECCI and EBSD techniques. Ion milling surface preparation technique was used to remove material from the surface and expose the microstructure at maximum depth of the indent. 750

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Visualization and Quantification of Plastic Strain Induced by Indentation in Polycrystalline Nickel

Kaboli¹,

Demers²,

Brodusch³

et al. 2013

Microsc Microanal

View full text Add to dashboard Cite

show abstract

Electron Channeling Contrast Observations in Deformed Magnesium Alloys

et al. 2014

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In industrial metal-forming processes, quantitative and physical models are required to control and optimize the microstructure of the finished products. A detailed understanding of the behavior of polycrystalline materials during deformation processes is essential to develop such models. A number of instruments and analytical tools are available for deformation studies within the microscopy and microanalysis community. In a scanning electron microscope (SEM), the visualization and characterization of deformed microstructures are carried out with electron channeling contrast imaging (ECCI) and electron backscattered diffraction (EBSD). These SEM studies provide a nanoscale spatial resolution, a large field of view and statistically reliable information on a bulk specimen [1]. In this study, complex variations of backscattering intensity (I BSE) were observed in ECCI micrographs of magnesium (Mg) grains after the uniaxial hot compression test. The variations of IBSE across the ECCI micrographs were attributed to plastic deformation of the Mg grains [2]. Recovery, recrystallization and phase transformation processes occurred simultaneously during deformation at high temperature. The interactions between the three processes lead to a complex deformed microstructure consisting of dynamically recrystallized grains and precipitates. The deformed microstructure varied with different deformation variables such as temperature, strain rate and strain [3,4].

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Scanning Electron Microscopy/1972: Proceedings of the 5th Annual Scanning Electron Microscope Symposium and Workshop on Biological Specimen Preparation for Scanning Electron Microscopy

Cited by 2 publications

References 0 publications

Visualization and Quantification of Plastic Strain Induced by Indentation in Polycrystalline Nickel

Visualization and Quantification of Plastic Strain Induced by Indentation in Polycrystalline Nickel

Electron Channeling Contrast Observations in Deformed Magnesium Alloys

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