Scanning Motions of an Atomic Force Microscope Tip in Water

Koga, Kenichiro; Zeng, Xiao Cheng

doi:10.1103/physrevlett.79.853

Cited by 14 publications

(16 citation statements)

References 28 publications

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“…(5) is solved by an iterative method with boundary condition eq. (8). Finally, the velocity v x ; v y of the fluid is obtained from the definition, eq.…”

Section: Solution Of Fluid Motion By the Vorticitymentioning

confidence: 99%

“…[8][9][10] Recently, we are developing theoretical simulation methods for the dynamic AFM in liquids treating such fundamental problems properly. The aim of the present paper is to propose a numerical method for the analyses of the cantilever bending motion in liquids and clarify various dynamic features, particularly for the dynamic tapping mode cases.…”

Section: Introductionmentioning

confidence: 99%

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Theoretical Analyses of Cantilever Oscillation for Dynamic Atomic Force Microscopy in Liquids

Tsukada

Watanabe²

2009

jjap

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We developed an efficient numerical method to simulate the oscillation motion of an elastic body of cantilever in liquids for measurements of dynamic atomic force microscopy (AFM). In this method the dynamics of the cantilever elastic body is solved simultaneously with the fluid motion caused by the cantilever oscillation. The results of the resonance curves both for the amplitude and the bending angle reproduce experimental features fairly well. The effects of the tapping processes of the tip to the oscillation are analyzed for various types of the tapping processes. The simulation method can be used for the analyses of the experimental data of the dynamic AFM in liquids and for designing the optimal shape of the cantilever and for choosing an appropriate experimental mode.

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“…(5) is solved by an iterative method with boundary condition eq. (8). Finally, the velocity v x ; v y of the fluid is obtained from the definition, eq.…”

Section: Solution Of Fluid Motion By the Vorticitymentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Theoretical Analyses of Cantilever Oscillation for Dynamic Atomic Force Microscopy in Liquids

Tsukada

Watanabe²

2009

jjap

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“…In the previous paper 5 we showed that the oscillatory behavior of ⌿ can result in discontinuous scanning trajectories for a single-atom tip, even if the surface is defect free. AFM experiments in the liquid environment have also shown that the force acting on the tip can be oscillatory when the tip approaches the surface vertically, reflecting the layering structure of liquid molecules near the surface.…”

Section: ͑3͒mentioning

confidence: 99%

“…12 This approach was originally developed for homogeneous systems. Recently this approach was extended by us to treat inhomogeneous systems 13,5 using the polymer RISM equation.…”

Section: ͑3͒mentioning

confidence: 99%

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Imaging point defects in a liquid environment: A model AFM study

Koga

Zeng

1999

Phys. Rev. B

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Effects of the liquid on atomic force microscopy ͑AFM͒ imaging are examined for a model system consisting of a hexagonal flake of seven Lennard-Jones ͑LJ͒ atoms as a multiatom tip, a monolayer of LJ crystal containing a single point defect as a substrate, and three-site model water as the liquid. A previous simulation ͓Koutsos et al., Europhys. Lett. 26, 103 ͑1994͔͒ has shown that the true atomic resolution of a point defect cannot be achieved in vacuum by use of the multiatom tip. Here we examine the feasibility of such atomic resolution when both the tip and substrate are immersed in a liquid. The liquid-induced interaction between the tip and the substrate is evaluated in the framework of the integral equation theory of molecular fluids extended for the system consisting of an infinitely large crystal. It is found that the potential of mean force indeed manifests the point defect even when the tip and the substrate are a few Angstroms apart. This implies that in the liquid environment the point defect could be discerned in the constant-height mode of AFM measurement. For the constant-load mode of AFM, a characteristic potential can be used to determine the stable, metastable, and unstable vertical position ͑height͒ of the tip at any lateral position. The contour surface of the stable heights reveals periodic features of the underlying lattice of the substrate except in the vicinity of the defect, provided certain load is applied. ͓S0163-1829͑99͒10543-5͔

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