Scanning thermal microscopy method for thermal conductivity measurement of a single SiO2 nanoparticle

Preparation of SiO2 resin coating with superhydrophobic wettability and anti-icing behavior analysis

“…Based on Fourier's law, Newton's cooling law and Stephen Boltzmann's law, the heat transfer process equation can be described as: α is the silica thermal conductivity is 0.27 W cm −1 K −1 , 33 R is the droplet radius, θ is contact angle of coating surface T d is the ambient temperature, is the temperature of trapped air T s is the droplet temperature.…”

Nanoscale thermal conductivity of Kapton-derived carbonaceous materials

“…This makes carbonized Kapton a convenient reference material for several thermal characterization techniques, which was recently exploited by our group in a study of Kapton-derived carbonaceous materials with three different techniques [10]: laser flash analysis, photothermal radiometry and Raman thermometry. Scanning Thermal Microscopy (SThM) is a known method for the characterization of local thermal conductivity of organic thin films [11][12][13], nanoobjects [14], 2D materials [15], 1D materials [16], monolayers [17] and down to single molecules [18][19][20]. In this technique, the thin film resistor in the tip of scanning probe microscope is essentially utilized as a thermometer that allows obtaining nanometric lateral resolution [21].…”

Thermal and electrical cross-plane conductivity at the nanoscale in poly(3,4-ethylenedioxythiophene):trifluoromethanesulfonate thin films

“…We used scanning thermal microscopy (SThM) for the characterization of local thermal properties of PEDOT:OTf. This technique is frequently applied to a large variety of samples, such as organic thin films, 15–17 nanomaterials 18–20 and single molecules. 21,22 In the SThM setup, the thin film resistor in the tip of the SThM cantilever is essentially utilized as a thermometer in order to probe temperature with nanometric lateral resolution (in the so-called passive mode) or to induce heat flow from the tip into the sample by supplying power to the aforementioned resistor (in the active mode), which can be used to find the thermal conductance of materials under study.…”