2000
DOI: 10.1209/epl/i2000-00370-1
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Scanning tunneling spectroscopy on the 6H−SiC(0001)(3 × 3) surface

Abstract: Surface topographic (STM) and spectroscopic (STS) studies have been performed on the Si-terminated 6H-SiC(0001)(3×3) surface using a scanning tunneling microscope (STM) in ultrahigh vacuum. High-quality (3 × 3) overstructures have been prepared as observed by LEED and STM. The regular (3 × 3) surface sites revealed much weaker I(V ) dependences as compared to the defect sites when measured using the constant tip-surface gap technique. The normalized (dI/dV )/(I/V ) vs. V spectra exhibit distinct bands of empty… Show more

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Cited by 23 publications
(16 citation statements)
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“…Spectroscopic STM investigations could confirm these results on an atomic level [86]. For the (3×3) phase the effect was also seen in the experiment [56,106,110]. In this case the Hubbard U is smaller, i.e.…”
Section: Electronic Structuresupporting
confidence: 72%
“…Spectroscopic STM investigations could confirm these results on an atomic level [86]. For the (3×3) phase the effect was also seen in the experiment [56,106,110]. In this case the Hubbard U is smaller, i.e.…”
Section: Electronic Structuresupporting
confidence: 72%
“…Indeed, three intrinsic surface states are located within the bulk band gap, in which two ͑S 1 and U 1 ͒ arise from strongly correlated electronic states and the third ͑S 2 ͒ has negligible electron correlation effects. 20,21 The morphology of the surface states has a significant influence on the electronic transport properties. Two features have to be distinguished: ͑i͒ the high localization induces strong electronic correlations, which are responsible of a gap opening in the energy distribution and the formation of two distinct surface states U 1 and S 1 , the so-called Mott-Hubbard electronic states, and ͑ii͒ the weak overlap between neighboring silicon adatoms is responsible for a reduced electronic mobility along the semiconductor surface through U 1 or S 1 .…”
Section: Introductionmentioning
confidence: 99%
“…A majority of these studies dealt with the Si-rich [1][2][3][4][5][6][7][8][9][10] (3ϫ3) and (ͱ3ϫͱ3)R30°͑Refs. 6 -24͒ reconstructions on 4H-and 6H-SiC(0001), the (3ϫ3) reconstruction 5,25 on 6H-SiC(0001 ), and the oxygen induced silicate adlayer reconstructions on 4H-and 6H-SiC͕0001͖ surfaces.…”
Section: Introductionmentioning
confidence: 99%