Scattering of Optical Radiation by a Rough Different-Scale Mirror Surface

Golovinsky, P. A.; Proskurin, D. K.

doi:10.1134/s0030400x20030078

Cited by 3 publications

(2 citation statements)

References 31 publications

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“…From (3) at the wavelength λ =3λ0 we will have the following: P(3λ0) =1; if (5), then 3λ0 = Sm. Therefore, the required analytical estimate p(λ) in our case has the final form…”

Section: Analytical Assessment Of the Spectral Coefficient Of Back Reflection P(λ) Using A Step Parameter With A Known Reflection Indicatmentioning

confidence: 99%

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A model of a reflective surface under the Shklovsky-de Genet topology

Gallyamova

Gallyamov

Kuznetsova

et al. 2022

IOP Conf. Ser.: Earth Environ. Sci.

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A rough surface is studied. Its reflective features are related to the geometry of a random allocation of a solid opaque medium, the surface of which separates it from a translucent medium. A model of a real rough surface is suggested. It is based on the Shklovsky-de Genet topology, which uses the concept of a connecting cluster, which is divided into a skeleton (core) and dead ends (drop points). A step parameter is chosen as the roughness value in the model, as it is reliably detected using a profilometer. It is demonstrated that data concerning the step parameter allows to analytically evaluate the spectral reflection coefficient of surfaces with a known reflection indicatrix in a wide range of wavelengths.

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“…From (3) at the wavelength λ =3λ0 we will have the following: P(3λ0) =1; if (5), then 3λ0 = Sm. Therefore, the required analytical estimate p(λ) in our case has the final form…”

Section: Analytical Assessment Of the Spectral Coefficient Of Back Reflection P(λ) Using A Step Parameter With A Known Reflection Indicatmentioning

confidence: 99%

“…In most of the papers still based on the Torrens-Sparrow [3] and Cook-Torrens [4] models, Gaussian statistics of irregularities are assumed. Therefore, the rough surface is presented as a set of randomly oriented mirror-reflecting microplats (facets) or steps [5]. Nevertheless, real surfaces can differ considerably from Gaussian ones.…”

Section: Introductionmentioning

confidence: 99%

A model of a reflective surface under the Shklovsky-de Genet topology

Gallyamova

Gallyamov

Kuznetsova

et al. 2022

IOP Conf. Ser.: Earth Environ. Sci.

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Study on scattering light field distribution of optical element in-surface defects based on Mueller matrix

et al. 2021

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For precise optical elements, the size of in-surface defects is at the nanometer scale. When incident light illuminates in-surface defects on optical elements, strong diffraction and scattering effects are produced, and this greatly reduces the beam quality in optical systems. In this study, a three-dimensional model of the in-surface defects of K9 optical components was established. On this basis, a theoretical model of electromagnetic scattering between the defect and the incident and scattering fields was constructed. The 4 × 4-order scattering Mueller matrix light field distributions of incident light modulated by different-sized defects were obtained by numerical simulations, and the influencing factors were analyzed. These simulations provide a theoretical basis and a reference for the manufacture of precision optical elements and a scale calibration for surface quality detection methods.

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Probabilistic Model of the Reflectivity of Construction Materials of the Agroindustrial Complex

Gallyamova¹

2021

EEAPK

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When developing modern lighting technologies for objects of the agro-industrial complex, the problem arises of assessing the contribution of reflected light to the normalized illumination. The reflective properties of the surfaces of materials are characterized by a reflection coeﬃcient ρ, which reaches a value of 0.7. This allows us to consider the reflective surfaces as an additional light source and the possibility of reducing energy consumption costs. (Research purpose) The research purpose is in developing a mathematical model that allows us to estimate the spectral reflection coeﬃcient ρ(λ) of materials of construction technologies of the agro-industrial complex in the ultraviolet and visible spectral regions. (Materials and methods) That the disadvantage of various models is the lack of an analytical method for calculating the reflection coeﬃcient in a wide range of wavelengths. We used a probabilistic method to overcome this disadvantage. (Results and discussion) The developed mathematical model makes it possible to estimate the reflection coeﬃcient of the rough surface of materials in a wide range of the spectrum. For concrete, the area of agreement between theory and experiment is in the wavelength range from 250 to 1000 nm. The saturation mode predicted by the theory (the independence of the reflection coeﬃcient from the wavelength) at a reflection coeﬃcient of 0.4 is consistent with the experimental values in the visible range of the spectrum for construction materials of the agro-industrial complex, in particular, gray textured concrete, gray facade paint, light wood, gray silicate brick, new plaster without whitewash. (Conclusions) In the case of normal light incidence, the developed mathematical model allows us to theoretically estimate the reflection coeﬃcient of the rough surfaces of construction technologies of the agro-industrial complex. The proposed model can be used in the development and design of a system of technological lighting of large-area premises (for example, when keeping birds on the floor), as well as for developing recommendations for reducing the energy consumption of existing lighting systems.

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Scattering of Optical Radiation by a Rough Different-Scale Mirror Surface

Cited by 3 publications

References 31 publications

A model of a reflective surface under the Shklovsky-de Genet topology

A model of a reflective surface under the Shklovsky-de Genet topology

Study on scattering light field distribution of optical element in-surface defects based on Mueller matrix

Probabilistic Model of the Reflectivity of Construction Materials of the Agroindustrial Complex

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