Scattering–reduction effect with overcoated rough surfaces: theory and experiment

Giovannini, Hugues; Amra, Claude

doi:10.1364/ao.36.005574

Cited by 23 publications

(9 citation statements)

References 22 publications

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“…The differential method allows the determination of the parameters for both rough surfaces and heterogeneous bulks. This rigorous method, which was initially designed for periodic structures [20,21] and was later extended to non-periodic ones [22,23], is not restricted to low roughness or long correlation lengths. However to keep reasonable calculation times (of the order of one hour on a 2 GHz computer) we restrain ourself to surfaces with lengths of a hundred of wavelengths and with roughness of a couple of wavelengths or less, in the case of surfaces invariant along one dimension.…”

Section: Description Of the Rough Surfacementioning

confidence: 99%

An enhanced contrast to detect bulk objects under arbitrary rough surfaces

Arnaud¹,

Georges²,

Sorrentini³

et al. 2009

Opt. Express

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We study a selective light scattering elimination procedure in the case of highly scattering rough surfaces. Contrary to the case of low scattering levels, the elimination parameters are shown to depend on the sample microstructure and to present rapid variations with the scattering angle. On the other hand, when the slope of the surface is moderated, we show that this parameters present smoother variations and little dependence to the microstructure, even when the roughness is high. These results allow an important selective reduction of the scattered light, with a basic experimental mounting and an analytical determination of the elimination parameters. Such selective scattering reduction is demonstrated by simulations and experiments and applied to the imaging of an object situated under a highly rough surface.

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Section: Description Of the Rough Surfacementioning

confidence: 99%

An enhanced contrast to detect bulk objects under arbitrary rough surfaces

Arnaud¹,

Georges²,

Sorrentini³

et al. 2009

Opt. Express

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“…Hence the characterization of random rough surfaces by light scattering has received considerable attention for both industrial and scientific purposes in recent years [10][11][12][13][14]. As it is used by the semiconductor, optical, and data storage industries to inspect materials for surface quality [14,15].…”

Section: Introductionmentioning

confidence: 99%

Single layer homogeneous model for surface roughness by polarized light scattering

Singh

Kapoor

2008

Optics & Laser Technology

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“…The characterization of random rough surfaces by light scattering has received considerable attention for both industrial and scientific purposes in recent years [7][8][9][10][11].As it is used by the semiconductor, optical, and data storage industries to inspect materials for surface quality [11,12]. Although the most direct way to probe a rough surface quantitatively is to measure the surface morphology by use of real space imaging techniques such as atomic-force microscopy (AFM) and scanning-tunneling microscopy (STM), light scattering does have some advantages over imaging: It is a non-contact method and can have a large sampling size [10,[13][14][15][16].…”

Section: Introductionmentioning

confidence: 99%

Effect of S and P polarization on single layer homogeneous model

Singh

Kapoor

2007

SPIE Proceedings

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This work describes a homogeneous single layer model for surface roughness by polarized light. It has been shown that the reflectance change in non-absorbing layer is directly proportional to the refractive index of the ambient and substrate media for s polarization but inversely proportional to the p polarization and it is directly proportional to the square of the thickness of the layer for both the polarization. The thickness of the film has been written in terms of surface roughness to correlate the homogeneous model with the scattering theory. The consequence of the scattered light on the specular reflectance and transmittance for oblique incidence shows that there is reduction in reflectance and transmittance, due to roughness on the surface under the Drude effective-medium approximation.

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Scattering–reduction effect with overcoated rough surfaces: theory and experiment

Cited by 23 publications

References 22 publications

An enhanced contrast to detect bulk objects under arbitrary rough surfaces

An enhanced contrast to detect bulk objects under arbitrary rough surfaces

Single layer homogeneous model for surface roughness by polarized light scattering

Effect of S and P polarization on single layer homogeneous model

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