Scene adaptive structured light using error detection and correction

Chen, Xida; Yang, Yee‐Hong

doi:10.1016/j.patcog.2014.07.014

Cited by 18 publications

(6 citation statements)

References 12 publications

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“…Coded structured light is considered one of the most reliable techniques for recovering objects' surfaces. Incorporating gray code methods (GCM) with phase shift methods (PSM) gives the benefits of both methods, namely unambiguity and robustness of GCM combined with the high resolution of PSM [8]. However, because of mismatches in resolution between projector and camera, out-of-focus cameras, etc., there is always a spike error in the unfolded absolute phase.…”

Section: Phase Expansion Problem With Reflected Light Interferencementioning

confidence: 99%

“…But this method degrades the signal-to-noise ratio of the captured image, and it cannot resolve the problem of mutual reflections of adjacent objects. Chen et al proposed an effective compensation framework that successfully eliminates errors caused by global illumination [3]. However, the complexity of the algorithm makes it difficult to implement.…”

Section: Introductionmentioning

confidence: 99%

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Phase chunking-based error correction method for structured light 3D measurement

Congzhen,

Chenxing

2023

Third International Computing Imaging Conference (CITA 2023)

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The method of phase shift combined with gray code has been applied to many fields due to the high precision and low cost. However, the interference from indirect light reflectance sometimes causes errors to the determination of orders for gray codes and finally leads to large errors for the 3D measurement result. In this paper, we propose a chunked correction algorithm to solve this problem. By exploiting the distinctive characteristics of high-frequency gray code patterns, we identify the potential error points firstly and then refine the mistakenly identified points according to the distribution of shadow areas. Following this, an initial correction of the order k for gray codes is performed using the nearest k-value correction algorithm. Finally, the phase chunking correction algorithm is used to corrects the absolute phase based on the modified orders of gray codes. Simulation under blender environment and real experiments are conducted to evaluate the performance of the proposed method, which shows effective to eliminate the errors caused by the indirect light reflectance.

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Section: Phase Expansion Problem With Reflected Light Interferencementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Phase chunking-based error correction method for structured light 3D measurement

Congzhen,

Chenxing

2023

Third International Computing Imaging Conference (CITA 2023)

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“…Global illumination includes the effects caused by inter-reflection, subsurface scattering and projector defocus [11]. Both subsurface scattering and defocus result in an ambiguous effect to the projected patterns and are categorised as short-range effects [9].…”

Section: Related Workmentioning

confidence: 99%

“…However, the embedded signal may not be identified correctly at every location, which will affect the absolute phase recovery. Chen et al [11] proposed a method projecting the binary code patterns to handle errors caused by the short-range and long-range effects. Their method has two stages.…”

Section: Related Workmentioning

confidence: 99%

Micro-phase measuring profilometry: Its sensitivity analysis and phase unwrapping

Tang

Zhang

2015

Optics and Lasers in Engineering

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“…Structured-light imaging is mainly used for 3D rebuilding and 3D surface measurements [6][7]. Geng delivered an overall description and detailed discussion of structured-light imaging [8].…”

Section: Introductionmentioning

confidence: 99%

Aesthetic defect characterization of a polymeric polarizer via structured light illumination

et al. 2016

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The aesthetic defects of polymeric polarizers have a serious impact on the quality of thin film transistor liquid crystal display (TFT-LCD) panels. However, some of these slight and transparent defects can barely be imaged and characterized using conventional illumination. To inspect these special defects, a new and automated inspection method is proposed that employs structured-light illumination. A machine vision system that uses a LCD monitor to produce a binary stripe pattern was designed to enhance the imaging defects. Thus, subsequent image processing is straightforward and simple because of this enhancement. One hundred and fifty defect samples were successfully imaged and then processed and characterized by the Robust Principal Component Analysis (RPCA) algorithm. The total inspection accuracy was up to 99%. The experiments demonstrate that the width of the luminous stripe should be optimized at 2 to 3 times the size of the defect. The mechanism of the imaging enhancement is preliminarily discussed.

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Scene adaptive structured light using error detection and correction

Cited by 18 publications

References 12 publications

Phase chunking-based error correction method for structured light 3D measurement

Phase chunking-based error correction method for structured light 3D measurement

Micro-phase measuring profilometry: Its sensitivity analysis and phase unwrapping

Aesthetic defect characterization of a polymeric polarizer via structured light illumination

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