SCRAP: Sequential circuits reliability analysis program

Mahdavi, Seyyed Javad Seyyed; Mohammadi, Karim

doi:10.1016/j.microrel.2009.06.001

Cited by 12 publications

(4 citation statements)

References 16 publications

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“…The concept of these algorithms is based on the fact that an error at the output of any gate is the cumulative consequent of a local error component related to that gate, and a propagated error component related to the failure of gates in its transitive fan-in cone. In [22] a reliability analysis for sequential circuits is presented based on second method.…”

Section: Introductionmentioning

confidence: 99%

Co-evolutionary Approach to Reduce Soft Error Rate of Implemented Circuits on SRAM_based FPGA

Jahanirad¹

2018

IJCA

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Soft errors such as Single Event Upset (SEU) have great effect on performance degradation of circuits implemented on SRAM_based FPGA. The soft error in configuration bits which control the logic and routing parts of the circuit, leads to permanent faults. In this paper, we have developed a coevolutionary method to reduce the effect of soft error on the implemented circuit on FPGA. This method is based on cooperation of genetic algorithm and ant colony optimization. The efficiency of co-evolutionary method has been proved by comparison of its results with the proposed genetic algorithm and ant colony optimization. The experimental results for some MCNC benchmark circuits show up to 34% improvement compare to genetic algorithm and up to 60% improvement against ant colony optimization.

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Section: Introductionmentioning

confidence: 99%

Co-evolutionary Approach to Reduce Soft Error Rate of Implemented Circuits on SRAM_based FPGA

Jahanirad¹

2018

IJCA

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“…To this end, various probabilistic analytical approaches for circuit reliability evaluation have been proposed, such as the Probability Element (ProxEl) method [2], the Probabilistic Transfer Matrices (PTM) formalism [3], the Probabilistic Gate Model (PGM) [4], [5], [6], the single-pass reliability analysis method [7], [8], the Signal Probability Reliability Analysis (SPRA) method [9], [10]. Only recently, probabilistic graphical models, have been applied in the context of IC reliability evaluation.…”

Section: Introductionmentioning

confidence: 99%

Probability density function based reliability evaluation of large-scale ICs

Laurenciu¹,

Cotöfană²

2014

Proceedings of the 2014 IEEE/ACM International Symposium on Nanoscale Architectures

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For the current advanced technology nodes, an accurate, yet fast reliability analysis is needed at design time, to enable the comparison between different circuit architectures, and thus a reliability-aware design and synthesis process. To this end we propose a reliability assessment framework that is able to estimate more accurately the circuit reliability and which can be applied to large-scale circuit settings, by: (i) taking into account the circuit topology (and implicitly its reconvergent fanouts), the input vectors, the environmental conditions and fault scenarios, (ii) employing a range of probabilities, i.e., a Probability Density Function (PDF), instead of hitherto single probability value, in order to quantify the circuit reliability, (iii) employing variational inference, to derive the circuit primary output PDFs, given its primary inputs PDFs, and (iv) adapting the traditional variational inference approach to exploit the peculiarities of the probabilistic model afferent to logic circuits, for convergence speed improvements and thus applicability in large scale circuits settings.

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“…Recent researches have focused on the use of Markov random fields [11], probabilistic model checking (PMC) [12], probabilistic transfer matrices (PTMs) [13], Bayesian networks [14], analytical and scalable approaches [15], probabilistic decision diagrams (PDDs) [16], Boolean difference calculus [17], signal probabilities [18], circuit transformations [19] and multiple passes for sequential circuits [20]. Several of these approaches, such as those using PMC [12], PTMs [13] and PDDs [16], provide accurate evaluation results, however, they are affected by the problems of state space explosion and an exponential complexity, which make them practically infeasible to be used for large circuits.…”

Section: Introductionmentioning

confidence: 99%

“…Particularly, a so-called single-pass method is able to accurately evaluate circuits without reconvergent fanouts and is applicable to other circuits by computing the correlation coefficients of dependent signals. This single-pass method is extended in [20] in the form of multiple passes for the reliability evaluation of sequential circuits.…”

Section: Introductionmentioning

confidence: 99%