SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

Takeuchi, S.; Muto, Atsushi; Nakagawa, Mayumi; White, Sara T.; Tamochi, Ryuichiro; Sato, Mitsugu; Yamada, Mitsuhiko; Joy, David C.

doi:10.1017/s1431927604880711

Cited by 3 publications

(4 citation statements)

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“…Also, a small Ni catalyst particle embedded in the CNF is visible as a bright spot, as indicated by arrows. 30. 3͑e͔͒, and as increases over 85°, the surface detail of the CNF also disappears but the internal density profile becomes visible ͓Figs.…”

Section: Resultsmentioning

confidence: 97%

“…We also assume that this distribution is independent of the tilt angle ͑͒ of the incident beam, 38 must be valid even at a very large tilt angle of 88°because the SE generation anisotropy, if any, will not have any correlation with the surface position of the material. While the SE detection system we used in the experiment has a wide SE acceptance window, 30 our treatment of all the SE capturing in the simulation could be an oversimplification. As for the signal detection, we count the number of captured SEs in obtaining the signal profile.…”

Section: Analysis and Discussionmentioning

confidence: 99%

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Bright-field transmission imaging of carbon nanofibers on bulk substrate using conventional scanning electron microscopy

Suzuki¹,

Ngo²,

Kitsuki³

et al. 2007

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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Monte Carlo simulation of scanning electron microscopy bright contrast images of suspended carbon nanofibers Appl. Phys. Lett. 90, 083111 (2007); 10.1063/1.2450655Bright contrast imaging of carbon nanofiber-substrate interface Electron field emission from room temperature grown carbon nanofibersThe authors present scanning transmission electron microscopy ͑STEM͒ of carbon nanofibers ͑CNFs͒ on a bulk substrate using conventional scanning electron microscopy ͑SEM͒ without specimen thinning. By utilizing the electron beam tilted Ͼ85°from the substrate normal, bright-field STEM contrast is obtained for the CNFs on substrate with conventional SEM. Analysis of the observed contrast using Monte Carlo simulation shows that the weakly scattered electrons transmitted from the CNF are selectively enhanced by the largely tilted substrate and result in the observed STEM contrast. This mechanism provides a useful STEM imaging technique to investigate the internal structure of materials on bulk substrates without destructive specimen thinning.

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Section: Resultsmentioning

confidence: 97%

Section: Analysis and Discussionmentioning

confidence: 99%

Bright-field transmission imaging of carbon nanofibers on bulk substrate using conventional scanning electron microscopy

Suzuki¹,

Ngo²,

Kitsuki³

et al. 2007

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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show abstract

“…The detectable energy windows for the signal electrons can be varied between the SE-dominated imaging ͑the energy of signal electrons Ͻ20-50 eV͒ and the backscattered-electron ͑BSE͒-dominated imaging ͑Ͼ20-50 eV͒, by optimizing the Wien filter condition in the electron optics. 20 a͒ Author to whom correspondence should be addressed. Electronic addresses: suzuki-makoto@naka.hiatchi-hitec.com.…”

Section: Methodsmentioning

confidence: 99%

Secondary electron emission from freely supported nanowires

Suzuki

Kumagai

Sekiguchi

et al. 2008

Journal of Applied Physics

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We present secondary electron ͑SE͒ emission results from freely supported carbon/silicon nitride ͑Si 3 N 4 ͒ hybrid nanowires using scanning electron microscopy. We found that, contrary to bulk materials, the SE emission from insulating or electrically isolated metallic nanowires is strongly suppressed by the penetrating beam. A mechanism of the SE suppression by the positive specimen charging is proposed, which is based on a total emission yield calculation using the Monte Carlo technique. This finding provides an important basis for studying low-energy electron emission from nanostructures under a penetrating electron beam.

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“…Efficient secondary electron collection, irrespective of their emitting direction, by the TTL detector is achieved with electron trapping by the magnetic field of snorkel type objective lens and extraction electric field above the sample. 15 SEM images presented below are mostly captured with the TTL detector, thus the image contrast is formed mainly by secondary electrons ͑SEs͒ emitted from the sample with kinetic energies below 50 eV.…”

Section: Methodsmentioning

confidence: 99%

Bright contrast imaging of carbon nanofiber-substrate interface

Suzuki

Ominami

Ngo

et al. 2006

Journal of Applied Physics

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We present the contrast mechanisms of scanning electron microscopy ͑SEM͒ for visualizing the interface between carbon nanofibers ͑CNFs͒ and the underlying substrate. SEM imaging with electron beam energies higher than a certain threshold provides different image contrasts depending on whether CNFs are in contact with the substrate or suspended above the substrate. CNFs with diameters ranging from 25 to 250 nm are examined with various electron beam energies. It is found that the threshold energy corresponds to the energy required to penetrate the CNF and its dependence on CNF diameter can be understood using the theory of electron range. This knowledge will be quite useful for interface imaging of all nanostructure devices.

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SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cited by 3 publications

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Bright-field transmission imaging of carbon nanofibers on bulk substrate using conventional scanning electron microscopy

Bright-field transmission imaging of carbon nanofibers on bulk substrate using conventional scanning electron microscopy

Secondary electron emission from freely supported nanowires

Bright contrast imaging of carbon nanofiber-substrate interface

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