Second-Harmonic Generation in CuCl Nanocrystal-Embedded Amorphous Indium Tin Oxide Thin Film

Thermal layer-by-layer preparation of oriented films of a Cu(i) ionic inorganic–organic hybrid material showing semiconducting and SHG properties

“…17 As evidenced in Figure 5, the non-zero SH value at β=0 and its dependence on β suggest the presence of some nanocrystals of 1 with orientation not perpendicular to the film surface. [20][21] We have evidence that the contribution of these not-oriented nanocrystals of 1 to the SH signal becomes more and more relevant with the number of cycles producing a decrease of the SHG signal, as expected for a decrease of the polar orientation of the nanocrystals of 1 by increasing the number of layers. The second order NLO coefficient d33 of the film after 4 and 9 cycles, obtained ex-situ by the standard Maker fringe method, is 0.57 and 2.10 pm/V, respectively.…”

“…SH sig-nal was normalized with respect to that of a calibrated quartz crystal wafer (X-cut) 1mm thick with d11 equal to 0.46 pm/V. 17,[20][21] SH polarization measurements at a fixed angle of incidence (α = 0°) were performed by measuring the p-polarization SH signal while changing the polarization angle β (defined as the angle between the incident fundamental polarization direction and the incident plane) of the fundamental beam by rotating a l/2 plate. β angles of 0° and 90° correspond to s-and p-polarization of the fundamental beam, respectively.…”