2006
DOI: 10.1016/j.asr.2005.02.027
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Secondary emission from dust grains with a surface layer: comparison between experimental and model results

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Cited by 6 publications
(5 citation statements)
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“…On the other hand, a number of problems was successfully solved or elucidated in course of the last decade. The behavior of primary electrons inside the dust grain is well described by the model [82,88] and their spectra (when leaving the grain) can be computed for different materials [85,92]. We know that the grain surface potential established by secondary emission depends neither on the work function nor on the secondary emission yield but rises with the mean atomic number of the grain material [60].…”
Section: Discussionmentioning
confidence: 99%
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“…On the other hand, a number of problems was successfully solved or elucidated in course of the last decade. The behavior of primary electrons inside the dust grain is well described by the model [82,88] and their spectra (when leaving the grain) can be computed for different materials [85,92]. We know that the grain surface potential established by secondary emission depends neither on the work function nor on the secondary emission yield but rises with the mean atomic number of the grain material [60].…”
Section: Discussionmentioning
confidence: 99%
“…However, the layer of surface impurities was not defined in this case. Thus, we have used MF (melamine-formaldehyde resin) 2.35 μm spheres covered with ≈ 20 nm of the Ni layer and adapted the model of the secondary emission [82] (see section 4) and analyzed the effects of the layer thickness [92]. It was found that the secondary emission yield increases with the thickness of the layer until a saturation is reached.…”
Section: Influence Of Surface Layersmentioning
confidence: 99%
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“…Thus, the charge of micrometer-sized grains can be either positive or negative and the charge sign depends on their shape, dimensions, and material. 5 Ion impacts may also induce the emission of secondary electrons, however, with a much lower yield and thus this effect is negligible in most environments.…”
Section: Introductionmentioning
confidence: 99%
“…Following models designed for scanning electron microscopy (e.g., Li et al 2008;Hovington et al 1997aHovington et al , 1997b, we have developed a numerical model of secondary emission from spherical objects suitable for various materials including metals (Richterová et al 2006a), insulators (Richterová et al 2007;Němeček et al 2011), and complex compounds (Richterová et al 2006b;Mann et al 2011). These papers give many examples of excellent agreement of model results with laboratory measurements on spherical samples; the deviations are of the order of single units percent.…”
Section: Introductionmentioning
confidence: 99%