“…In fact, positive‐ion surface spectra of the as‐grown CeO 2 /ZrO 2 /cordierite samples showed species related both to CeO 2 and to ZrO 2 single‐phase coatings (Ce + , CeH + , CeO x + (x = 1, 2), CeOH + , Zr + , ZrO x + (x = 0–2)), as well as to cordierite substrate (Mg + , Mg 2 O + , Si + , Si 2 + , Si 2 O + , Al + , Al 2 + , Al 2 O + , AlO + ). Moreover, as often observed for similar samples,19,20 signals coming from processing contamination were distinguished (Li + , CH x + (x = 0, 3), Na + , K + , Ca + , Cl + , CaO + ). Taking into account that surface XPS analysis for the same coatings did not detect the presence of ZrO 2 in ceria film before the annealing process, signals related to ZrO 2 or substrate distinguished by SIMS are a consequence of different sampling depth and enhanced sensitivity with respect to XPS 20,21…”