Secondary ion mass spectrometry of metal salts: Polyatomic ion emission

Barlak, T. M.; Campana, Joseph E.; Wyatt, J. R.; Dunlap, Brett I.; Colton, Richard J.

doi:10.1016/0020-7381(83)80167-3

Cited by 47 publications

(8 citation statements)

References 9 publications

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“…In addition to reviewing work [1,2,3], we draw attention to those instructive findings which in particular describe some of the general characteristics of these clusters, like for instance the magic number problem which was related to the cluster structures, the internal energy content, the evaporation behaviour and the cluster ion lifetime [8,9,10,11].…”

Section: Introductionmentioning

confidence: 99%

Direct fission versus sequential evaporation mechanism of sputtered caesium iodide cluster ions

Drewello

Herzschuh

Stach

1993

Z Phys D - Atoms, Molecules and Clusters

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Abstract.A triple stage hybrid mass spectrometer was scanned for the trapping of the reaction intermediates of the over-all loss of two CsI-moieties from size-selected caesium iodide cluster ions of the general formula Cs (CsI). + . In addition to appropriate MS/MS/MS-methods an electrically floated collision cell has been applied to trap intermediates of unimolecular and collision-induced evaporations. In comparison with other experimental findings the features of the evaporation mechanism are discussed.

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Section: Introductionmentioning

confidence: 99%

Direct fission versus sequential evaporation mechanism of sputtered caesium iodide cluster ions

Drewello

Herzschuh

Stach

1993

Z Phys D - Atoms, Molecules and Clusters

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“…7 We concluded from these observations that the anomalous ion abundance regions were a result of unimolecular dissociations or, more appropriately, unicluster dissociations of the cluster ions. 11 Independent SIMS studies on Csl were performed on a timeof-flight (TOF) mass spectrometer12,13 where the mass spectra recorded corresponded to the ion abundance distributions at very short times (<200 ns) after the cluster ions were emitted. (Fragment ions from dissociations occurring after acceleration secondary cluster ion distribution is similar to those we previously reported with the double-focusing SIMS instrument; however, anomalous regions are not observed in the TOF data.…”

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confidence: 99%

Unicluster dissociation of large alkali iodide cluster ions

Campana¹,

Green²

1984

J. Am. Chem. Soc.

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“…The fall with increasing t is slower than for Si since the binding energy of Ge, at 3.81 eV, is significantly lower than that at 4.66 eV for Si. The correlation of the cluster structures and their stabilities in the emitted secondary ion intensity was seen, earlier, in the studies of alkali halides by Barlak et al [34,46]. There, stable, low-energy cubic-like h ϫ k ϫ l filled structures were observed where h, k, and l were all odd-numbered values.…”

Section: ‫ء‬mentioning

confidence: 53%

Relationships between cluster secondary ion mass intensities generated by different cluster primary ions

Seah

Green

Gilmore

2010

J. Am. Soc. Mass Spectrom.

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Measurements are described to evaluate the constitution of secondary ion mass spectra for both monatomic and cluster primary ions. Previous work shows that spectra for different primary ions may be accurately described as the product of three material-dependent component spectra, two being raised to increasing powers as the cluster size increases. That work was for an organic material and, here, this is extended to (SiO 2 ) t OH Ϫ clusters from silicon oxide sputtered by 25 keV Bi n ϩ cluster primary ions for n ϭ 1, 3, and 5 and 1 Յ t Յ 15. These results are described to a standard deviation of 2.4% over 6 decades of intensity by the product of a constant with a spectrum, H SiOH ‫ء‬ , and a power law spectrum in t. This evaluation is extended, using published data for Si t ϩ sputtered from Si by 9 and 18 keV Au Ϫ and Au 3 Ϫ , with confirmation that the spectra are closely described by the product of a constant with a spectrum, H Si ‫ء‬ , and a simple spectrum that is an exponential dependence on t, both being raised to appropriate powers. This is confirmed with further published data for 6, 9, 12, and 18 keV Al Ϫ and Al 2 Ϫ primary cluster ions. In all cases, the major effect of intensity is then related to the deposited energy of the primary ion at the surface. The constitution of SIMS spectra, for monatomic and cluster primary ion sources, is shown, in all cases, to be consistent with the product of a constant with two component spectra raised to given powers. (J Am Soc Mass Spectrom 2010, 21, 370 -377) © 2010 American Society for Mass Spectrometry T he analysis of complex molecules in SIMS has been enhanced in recent years by the application of primary cluster ions of the type Au n Ϯ , Bi n ϩ , C 60 nϩ , etc. These provide significantly higher yields of the larger fragments that are important in the analysis of larger molecules. Over the years, there has not been a great focus on the relative intensities of the many secondary ions in the spectrum and their changes with the change in primary ion cluster size and energy. Analysts have usually focused on the enhancement of intensity of a particular characteristic ion obtained when using larger cluster primary ions. However, the fragment ions in the spectrum can be used to construct the structure of the molecules or the arrangement of atoms at a surface as well as provide important data as a function of depth in depth profiles [1][2][3][4][5][6][7][8]. Studies of the whole secondary ion spectrum and its evolution from one primary ion source to another are an important part of the infrastructure to the whole field of secondary ion mass spectrometry.Much historical data and data in spectral libraries [9 -11] are for inert gas primary ions. Over the years, the primary ion sources used have changed and changed again. Different spectrometer manufacturers fit different primary ion sources. It is important, therefore, if analysts are to make the best use of their instruments and of the published literature and data sources, that the relationships for the secondary ion ...

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Secondary ion mass spectrometry of metal salts: Polyatomic ion emission

Cited by 47 publications

References 9 publications

Direct fission versus sequential evaporation mechanism of sputtered caesium iodide cluster ions

Direct fission versus sequential evaporation mechanism of sputtered caesium iodide cluster ions

Unicluster dissociation of large alkali iodide cluster ions

Relationships between cluster secondary ion mass intensities generated by different cluster primary ions

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