2020
DOI: 10.1002/adfm.202002201
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Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Abstract: Metal halide perovskite (MHP) solar cells have attracted much attention due to the rapidly growing power conversion efficiency that has reached 25.2% in a decade, comparable to established commercial photovoltaic modules. Compositional engineering is one of the most effective methods to boost the performance of MHP solar cells. Further improving the efficiency and the stability of MHP solar cells necessitates good understanding of the chemical–efficiency correlation and the chemical evolution during the degrad… Show more

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Cited by 36 publications
(24 citation statements)
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References 193 publications
(264 reference statements)
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“…At the same time, there is a small amount of Cl scattered throughout the interior of the perovskite film, which further confirms that the Cl ions have been successfully incorporated into the lattice of the perovskite film, as evidenced by the XRD measurement. [47] According to the previous characterization of the perovskite film properties, there are well-documented advantages to adopting the NSs modification strategy in terms of improving device performance. Figure 4a shows a diagram of the device structure of the DSM PSCs.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…At the same time, there is a small amount of Cl scattered throughout the interior of the perovskite film, which further confirms that the Cl ions have been successfully incorporated into the lattice of the perovskite film, as evidenced by the XRD measurement. [47] According to the previous characterization of the perovskite film properties, there are well-documented advantages to adopting the NSs modification strategy in terms of improving device performance. Figure 4a shows a diagram of the device structure of the DSM PSCs.…”
Section: Resultsmentioning
confidence: 99%
“…At the same time, there is a small amount of Cl scattered throughout the interior of the perovskite film, which further confirms that the Cl ions have been successfully incorporated into the lattice of the perovskite film, as evidenced by the XRD measurement. [ 47 ]…”
Section: Resultsmentioning
confidence: 99%
“…[ 210 ] Figure 13 a shows the working principle of ToF‐SIMS. [ 211 ] During measurement, a primary ion beam is used to bombard the sample surface, which causes the emission of secondary ions. The emitted secondary ions are then accelerated into a “flight tube” at different velocities depending on their mass‐to‐charge ratio.…”
Section: Interface‐sensitive Techniquesmentioning
confidence: 99%
“…All elements in the periodic table can be detected, including hydrogen. [ 211 ] In addition to the primary ion source, ToF‐SIMS instruments are often equipped with an auxiliary ion beam used for sputter etching the sample. Depth profiles can be obtained by performing the experiment with a dual beam in pulsed mode.…”
Section: Interface‐sensitive Techniquesmentioning
confidence: 99%
“…And the existence of ion migration was confirmed by photothermal-induced resonance (PTIR) microscopy, time-offlight secondary ion mass spectrometry (ToF-SIMS), and temperature-dependent impedance spectroscopy. [92][93][94][95] Ion migration is considered to be an inherent characteristic of perovskite, which not only causes the unbalanced element distribution and unstable structure in the light-absorbing layer, but also a possible origin of the hysteresis that cannot be ignored. [96,97] Take typical MAPbI 3 -based PSCs as an example, the ion species that can migrate include interstitial iodide ions (I i ), I À , Pb 2þ , and MA þ and the corresponding vacancies (V I , V MA , and V Pb ).…”
Section: Ion Migrationmentioning
confidence: 99%