2012
DOI: 10.1063/1.4705400
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Secondary resonance magnetic force microscopy

Abstract: In this study, we have developed secondary resonance magnetic force microscopy (SR-MFM) for imaging alternating magnetic fields from a sample surface at the secondary resonant frequency of the magnetic cantilever at the same time as the topographic image. SR-MFM images of alternating magnetic fields diverging from the main pole in a driving perpendicular magnetic recording head are presented, and the divergence and convergence of the fields are discussed. The spatial resolution of SR-MFM is estimated to be 18 … Show more

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Cited by 8 publications
(1 citation statement)
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“…Moreover, because of the diamond tip's well-defined material composition and extremely sharp end radius (<10 nm), quantitative and high-resolution field maps of the pole can be reconstructed. Our method thus provides advantages over magnetic force microscopy (MFM) 13 14 15 16 17 and electron holography 18 , which are difficult to quantify, barely reach sufficient resolution, or provide two-dimensional projections.…”
mentioning
confidence: 99%
“…Moreover, because of the diamond tip's well-defined material composition and extremely sharp end radius (<10 nm), quantitative and high-resolution field maps of the pole can be reconstructed. Our method thus provides advantages over magnetic force microscopy (MFM) 13 14 15 16 17 and electron holography 18 , which are difficult to quantify, barely reach sufficient resolution, or provide two-dimensional projections.…”
mentioning
confidence: 99%