2019
DOI: 10.1149/2.0101905jss
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Selection and Optimization of Corrosion Inhibitors for Improved Cu CMP and Post-Cu CMP Cleaning

Abstract: Corrosion inhibitors play a key role in obtaining global planarization and protecting against corrosion during copper CMP. However, these inhibitors leave organic residues and increase particle contamination after the CMP process, which can directly affect the device yield. Cu CMP is usually performed with a slurry containing silica particles and a BTA corrosion inhibitor. High levels of organic defects and particle contamination are produced due to the high concentration of BTA used to meet CMP requirements. … Show more

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Cited by 44 publications
(20 citation statements)
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“…The Cu ions combine with the complexing agent to form a Cu complex [13][14][15]. Corrosion inhibitors reduce the corrosion reaction in the trench at the wafer pattern, enabling global and local planarization [16][17][18].…”
Section: Introductionmentioning
confidence: 99%
“…The Cu ions combine with the complexing agent to form a Cu complex [13][14][15]. Corrosion inhibitors reduce the corrosion reaction in the trench at the wafer pattern, enabling global and local planarization [16][17][18].…”
Section: Introductionmentioning
confidence: 99%
“…Chemical agents, such as surfactants, buffing agents, complexing (or chelating) agents, and corrosion inhibitors, are also included in wastewater [33,34]. According to Lo's study [21] and previous studies on CMP [2,[33][34][35][36][37][38][39][40][41][42], CMP and post-CMP cleaning wastewater contains various chemicals and materials, as listed in Table 1.…”
Section: Cmp Wastewater Treatmentmentioning
confidence: 99%
“…were studied and their action as complexing agents is confirmed [13][14][15]. Benzotriazole (BTA), their derivative such as 1H-benzotriazole and 5-methyl benzotriazole [16][17], and polyvinyl pyrrolidone (PVP) [18] were some of the corrosion inhibitors reported for Cu CMP. This research work highlights the scope of sodium carbonate and potassium carbonate as oxidizers for Cu CMP and draws a comparative statement.…”
Section: Introductionmentioning
confidence: 99%