The monolithic integration of a ZnSe metalsemiconductor-metal photodiode and an InGaP/GaAs heterojunction bipolar transistor has been achieved successfully on a GaAs substrate. As a result of a current amplification ratio of 20.8, the present monolithic photoreceiver illuminated at an optical input-power intensity of 10 μW has shown high voltage amplification sensitivity of −29.6 mV/μW. The fabrication process and characterization for the integrated device will be useful for the development of wide-bandgap-based short-wavelength optoelectronic integrated circuits in the future.
Index Terms-Heterojunction bipolar transistors (HBT),InGaP, metal-semiconductor-metal (MSM), photoreceiver, ZnSe.