Self-Aging-Prognostic GaN-Based Switching Power Converter Using <i>T<sub>J</sub>
                  </i>-Independent Online Condition Monitoring and Proactive Temperature Frequency Scaling

Chen, Yingping; Brian, D.

doi:10.1109/tpel.2020.3029450

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Self-Aging-Prognostic GaN-Based Switching Power Converter Using T_J -Independent Online Condition Monitoring and Proactive Temperature Frequency Scaling

Cited by 9 publications

References 24 publications

On-Chip Condition Monitoring of GaN Power Devices Using T_J-Independent T_ON Precursor for Device Aging and Gate Leakage I_GSS for Dielectric Failure

On-Chip Condition Monitoring of GaN Power Devices Using T_J-Independent T_ON Precursor for Device Aging and Gate Leakage I_GSS for Dielectric Failure

A Monolithic GaN Power IC With On-Chip Gate Driving, Level Shifting, and Temperature Sensing, Achieving Direct 48-V/1-V DC–DC Conversion

Enabling Online GaN Power Device Self-Health Monitoring With Analog SGD Supervised Learning and T _J-Independent Precursor Measurement

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Self-Aging-Prognostic GaN-Based Switching Power Converter Using TJ -Independent Online Condition Monitoring and Proactive Temperature Frequency Scaling

Cited by 9 publications

References 24 publications

On-Chip Condition Monitoring of GaN Power Devices Using TJ-Independent TON Precursor for Device Aging and Gate Leakage IGSS for Dielectric Failure

On-Chip Condition Monitoring of GaN Power Devices Using TJ-Independent TON Precursor for Device Aging and Gate Leakage IGSS for Dielectric Failure

A Monolithic GaN Power IC With On-Chip Gate Driving, Level Shifting, and Temperature Sensing, Achieving Direct 48-V/1-V DC–DC Conversion

Enabling Online GaN Power Device Self-Health Monitoring With Analog SGD Supervised Learning and T J -Independent Precursor Measurement

Contact Info

Product

Resources

About

Self-Aging-Prognostic GaN-Based Switching Power Converter Using T_J -Independent Online Condition Monitoring and Proactive Temperature Frequency Scaling

On-Chip Condition Monitoring of GaN Power Devices Using T_J-Independent T_ON Precursor for Device Aging and Gate Leakage I_GSS for Dielectric Failure

On-Chip Condition Monitoring of GaN Power Devices Using T_J-Independent T_ON Precursor for Device Aging and Gate Leakage I_GSS for Dielectric Failure

Enabling Online GaN Power Device Self-Health Monitoring With Analog SGD Supervised Learning and T _J-Independent Precursor Measurement