2021
DOI: 10.11591/ijeecs.v22.i2.pp688-698
|View full text |Cite
|
Sign up to set email alerts
|

Self-diagnostic approach for cell counting biosensor

Abstract: <span id="docs-internal-guid-66699b2e-7fff-5c7e-3931-5de920908f42"><span>In this research, a test monitoring strategy for an array of biosensors is proposed. The principle idea of this diagnostic technique is to measure and compare the impedance of each sensor in the array to achieve fully controlled online health monitoring technique at the system level. The work includes implementation of the diagnostic system, system architecture for analogue part, and SNR analysis. The technique has been applie… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 24 publications
0
1
0
Order By: Relevance
“…In contrast to IC trying out, MEMS trying out is on this manner greater exorbitant for the most part, talking to, in multiple cases, as much as 50% of the fetched of the realization product [9], [12]- [14]; integrated self-test (BIST) strategies can provide assist adjusted those cost-furnished publications of motion. All these are publicized to check over numerous areas of imperativeness and meddle [15]- [17]. Be that as it may, because of the prolonged complexity in comparison to ICs, BIST for MEMS as it have been risen in 1989 [18]- [22].…”
Section: Introductionmentioning
confidence: 99%
“…In contrast to IC trying out, MEMS trying out is on this manner greater exorbitant for the most part, talking to, in multiple cases, as much as 50% of the fetched of the realization product [9], [12]- [14]; integrated self-test (BIST) strategies can provide assist adjusted those cost-furnished publications of motion. All these are publicized to check over numerous areas of imperativeness and meddle [15]- [17]. Be that as it may, because of the prolonged complexity in comparison to ICs, BIST for MEMS as it have been risen in 1989 [18]- [22].…”
Section: Introductionmentioning
confidence: 99%