2018
DOI: 10.1039/c8nr06390g
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Self-passivated ultra-thin SnS layersviamechanical exfoliation and post-oxidation

Abstract: An SnS layer with a monolayer thickness was realized with a stable SnOx passivation layer via mechanical exfoliation, followed by moderate oxygen annealing.

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Cited by 45 publications
(72 citation statements)
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“…1a, b), leaving the lone pair electrons in the Sn atoms. The lone pair electrons contribute to the strong interlayer force 36,37 . Therefore, the in situ observation of SnS growth has confirmed a very high growth rate in the perpendicular direction 38 .…”
Section: Resultsmentioning
confidence: 99%
“…1a, b), leaving the lone pair electrons in the Sn atoms. The lone pair electrons contribute to the strong interlayer force 36,37 . Therefore, the in situ observation of SnS growth has confirmed a very high growth rate in the perpendicular direction 38 .…”
Section: Resultsmentioning
confidence: 99%
“…The high‐resolution spectra of S can be fitted by a mixed Gaussian–Lorentzian asymmetric line shape function. Each S 2p peak consists of a 2p 3/2 (160.9 eV)–2p 1/2 (162.0 eV) doublet with a 1.1 eV splitting due to the spin–orbit coupling 46. Similar to the case of the Sn 3d peaks, the S 2p peaks of 2 and 5 ML SnS show a 0.6 and a 0.5 eV upward BE shift, and no S 2p peaks of SnS 2 are detected at 164 eV.…”
Section: Resultsmentioning
confidence: 99%
“…Moreover, most of prepared SnS films are polycrystalline with various crystalline orientations, making it difficult to control the carrier transport and resulting in a negative influence on the FET performance. Higashitarumizu et al46 fabricated 0.7 nm and 9 ML FETs with SnS material obtained by mechanical exfoliation. These FETs have a similar performance when compared to our 2 ML and 10 ML FETs with the SnS material obtained by PLD.…”
Section: Resultsmentioning
confidence: 99%
“…To further confirm the growth of monochalcogenide SnS layers, Raman spectroscopy was performed which shows active vibrational modes at 94.21, 185.61, and 219.6 cm −1 that can be assigned to the A g phonon modes and the peak at 158.21 cm −1 assigned to B 3g orthorhombic mode of layered SnS (Figure 1g). [ 20,25 ] The Raman spectra obtained from the layers before and after device fabrication were identical and did not show any discernible change. The Raman peaks only show the vibrational modes associated with SnS.…”
Section: Figurementioning
confidence: 92%
“…[ 17–19 ] Strong inter layer interactions resulting from lone pair electrons associated with each S atom is a prominent reason for the inability to isolate ultrathin layers of SnS [ 6 ] using established mechanical cleaving processes. These interactions are stronger than the vdW forces exhibited between SnïŁżS layers, [ 20 ] that generate substantial energy distribution and strong charge transfer resulting in electronic coupling between adjacent layers. [ 20,21 ] Low‐temperature liquid metals present an opportunity to obtain ultrathin layers [ 22,23 ] with relatively large lateral dimensions.…”
Section: Figurementioning
confidence: 99%