2003
DOI: 10.1063/1.1599622
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Self-pulsation in InGaN laser diodes with saturable absorber layers

Abstract: Self-pulsating InGaN laser diodes with a p-type InGaN saturable absorber (SA) layer are demonstrated. The SA layer consists of a 1-nm-thick p-type InGaN well surrounded by 2-nm-thick p-type In0.02Ga0.98N barriers. The lower barrier of the SA is located on the 18-nm-thick p-type Al0.3Ga0.7N evaporation-prevention layer of the active region. Self-pulsation is demonstrated for output powers in the range 4 to 22 mW with corresponding self-pulsation frequencies in the range 1.6 to 2.9 GHz. Results indicate that the… Show more

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Cited by 17 publications
(15 citation statements)
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“…Within the quantum well thickness range from 1 to 6 nm, the carrier lifetime was found to increase from 180 to 340 ps. It has been suggested previously [24] that self-pulsating operation would occur in an InGaN laser with a very short carrier lifetime in the SA. In that work, two lasers were fabricated with the same structure except that one had an additional 20 nm p-type GaN layer between the AlGaN evaporation prevention layer and the SA layer.…”
Section: Resultsmentioning
confidence: 99%
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“…Within the quantum well thickness range from 1 to 6 nm, the carrier lifetime was found to increase from 180 to 340 ps. It has been suggested previously [24] that self-pulsating operation would occur in an InGaN laser with a very short carrier lifetime in the SA. In that work, two lasers were fabricated with the same structure except that one had an additional 20 nm p-type GaN layer between the AlGaN evaporation prevention layer and the SA layer.…”
Section: Resultsmentioning
confidence: 99%
“…This difference in behavior may be a result of the different carrier lifetimes in the active region and in the SA. In some of our devices, the SA layer has an interface with the AlGaN evaporation prevention layer [24] and this may reduce the carrier lifetime in the SA due to interfaceinduced nonradiative recombination. Also we found that such a bifurcation diagram with generation of SP through a Hopf bifurcation is appropriate for lasers with a short cavity length.…”
Section: Resultsmentioning
confidence: 99%
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“…1. The theoretical analysis is based on structure of actually fabricated laser samples [12], [13]. The model consists of the InGaN active layer and a p-type InGaN layer as an SA.…”
Section: Laser Structure Model and Equationsmentioning
confidence: 99%
“…High-brightness light emitting diodes (LEDs) and high-power laser diodes (LDs) based on these materials are already commercially available. With the emergence of white LEDs [1], high-density memory devices [2], and high-power microelectronics [3], a more fundamental understanding of Group III-nitride device performance is needed. This information is especially critical for the design and fabrication of advanced devices that include ternary and quaternary alloys.…”
Section: Introductionmentioning
confidence: 99%