2011
DOI: 10.1007/978-3-642-11125-9
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Semiconductor Power Devices

Abstract: The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use.

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Cited by 580 publications
(203 citation statements)
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“…4H-SiC 9.7 [90] 980 [90] 3.1 [213] 370 [90] In general, for UWBG materials to have impact on these applications, vertical device structures [90,214,215] similar to those utilized today for Si and SiC will need to be developed. While lateral UWBG devices such as HEMTs or MESFETs may be quite useful for high-frequency switching applications (and preliminary devices of this type have been realized in the AlGaN [157] and (AlGa) 2 O 3 [216] systems), lateral devices will likely be less useful for very high-voltage (defined somewhat arbitrarily as >5 kV) applications.…”
Section: Methodsmentioning
confidence: 99%
“…4H-SiC 9.7 [90] 980 [90] 3.1 [213] 370 [90] In general, for UWBG materials to have impact on these applications, vertical device structures [90,214,215] similar to those utilized today for Si and SiC will need to be developed. While lateral UWBG devices such as HEMTs or MESFETs may be quite useful for high-frequency switching applications (and preliminary devices of this type have been realized in the AlGaN [157] and (AlGa) 2 O 3 [216] systems), lateral devices will likely be less useful for very high-voltage (defined somewhat arbitrarily as >5 kV) applications.…”
Section: Methodsmentioning
confidence: 99%
“…In this pressure packaging system, [1] for an optimal electrical and thermal contact, hence in the case of multi-chip modules, the uneven pressure distribution could affect the electrical and thermal properties.…”
Section: A Prototype Design and Single Chip Module Characterizationmentioning
confidence: 99%
“…It has already been used for large area thyristors and it is basically a semiconductor wafer compressed between two copper poles, using an intermediate contact to match the coefficient of thermal expansion (CTE) of the materials in direct contact [1].…”
Section: Introductionmentioning
confidence: 99%
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“…The thermal connection of a power semiconductor on the heat sink is currently investigated in many research institutes and research facilities [1]- [3]. Each layer of the thermal connection has a number of functions in order to ensure the operation of the power semiconductor.…”
Section: Introductionmentioning
confidence: 99%