2019
DOI: 10.7567/1882-0786/ab5d46
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Semiconductor THz microsensors based on ultrahigh-contrast T-shape patterned interferometers

Abstract: A plasmonic interferometer consisting of a T-shape patterned semiconductor is investigated in THz regime. The microslit couples incident THz radiation into unidirectional SPPs waves, which are reflected by bilateral sidewalls and interfere with directly transmitted THz wave. The phase/amplitude of interfering SPPs waves can be effectively engineered by structural tuning, offering a flexible and efficient control over the shape of interference pattern. Spectral fringes with large amplitude and high contrast hav… Show more

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Cited by 1 publication
(3 citation statements)
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“…Hence, the parameters of the microslit (i.e., D and H ) can be approximately designed to maximize the intensities of two interfering SPPs waves in the spectral range of interest. In order to maximize the excitation efficiency of SPPs waves, the physical parameters of the slit were chosen as D = 60 μm and H = 300 μm [ 28 ]. Figure 4 b,c shows the simulated electric field distributions at positions of interference peak ( λ = 300 μm) and valley ( λ = 316 μm) with a separation length of L = 2000 μm, respectively.…”
Section: Discussion Of Bragg Mirrors-assisted Spps Interferometermentioning
confidence: 99%
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“…Hence, the parameters of the microslit (i.e., D and H ) can be approximately designed to maximize the intensities of two interfering SPPs waves in the spectral range of interest. In order to maximize the excitation efficiency of SPPs waves, the physical parameters of the slit were chosen as D = 60 μm and H = 300 μm [ 28 ]. Figure 4 b,c shows the simulated electric field distributions at positions of interference peak ( λ = 300 μm) and valley ( λ = 316 μm) with a separation length of L = 2000 μm, respectively.…”
Section: Discussion Of Bragg Mirrors-assisted Spps Interferometermentioning
confidence: 99%
“…On the basis of the above discussions, we note that the proposed interferometric sensor could be either operated based on the spectral shift monitoring or the intensity interrogation at several wavelengths, or in other words, it possesses a distinguished spectroscopic capability in practical applications to maintain high sensing performance over a wide wavelength range. Particularly, by comparing the performance with that for the T-shape patterned Interferometers reported in [ 28 ], the FoM is moderately enhanced by a factor of 1.2. However, the shortcomings of utilizing the T-shape pattern were also very distinct.…”
Section: Potential For Use As Interferometric Sensorsmentioning
confidence: 99%
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