“…The aspect ratio and interval influence the bending stiffness of the dielectric layer, as indicated in Equation (2).
where B, n, E, l , and b are the bending stiffness, number of microcolumns, Young's modulus, and the cross‐sectional length and width of the microcolumn, [
35 ] as shown in the inset in Figure 1a. In this work, the Young's modulus and the height of the microcolumns remain constant.…”