Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit Board

Shringarpure, Ketan; Pan, Shuya; Kim, Jingook; Fan, Jun; Achkir, Brice; Archambeault, Bruce; Drewniak, James L.

doi:10.1109/temc.2017.2673851

Cited by 15 publications

(6 citation statements)

References 13 publications

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“…is the EMI p.s.d. and G( f ) is the resonant coupling transfer function defined in (3). By introducing in (6) the expressions of S S ( f ), S N ( f ) and G( f ) derived above, the capacity of the sub-channel C 1 affected by EMI can be explicitly evaluated as…”

Section: Emi-induced Channel Capacity Lossmentioning

confidence: 99%

“…Due to the widespread diffusion of highly integrated information and communication technology (ICT) systems like smartphones, tablets and intelligent sensor nodes, digital communication modules operate in a more and more harsh electromagnetic environment, in which electromagnetic interference (EMI) from digital integrated circuits (ICs) and switching mode power converters can be easily coupled to the nominal signal path via the silicon substrate, the IC package and the power distribution network of ICs and printed circuit boards (PCBs), resulting in a degraded bit error rate (BER) and possibly in a complete communication failure [1][2][3][4][5][6][7].…”

Section: Introductionmentioning

confidence: 99%

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Interference of Spread-Spectrum EMI and Digital Data Links under Narrowband Resonant Coupling

Crovetti

Musolino

2020

Electronics

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In this paper, the effects of electromagnetic interference (EMI) coupled to a radio-frequency (RF) communication channel by resonant mechanisms are investigated and described in the framework of Shannon information theory in terms of an equivalent channel capacity loss so that to analyze and compare the effects of non-modulated and random Spread Spectrum (SS) modulated EMI. The analysis reveals a higher EMI-induced capacity loss for SS-modulated compared to non modulated EMI under practical values of the quality factor Q, while a modest improvement in the worst case capacity loss is observed only for impractical values of Q. Simulations on a 4-quadrature amplitude modulation (4-QAM) digital link featuring Turbo coding under EMI resonant coupling reveal that SS-modulated EMI gives rise to higher bit error rate (BER) at lower EMI power compared non-modulated EMI in the presence of resonant coupling for practical values of Q, thus suggesting a worse interfering potential of SS-modulated EMI.

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Section: Emi-induced Channel Capacity Lossmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Interference of Spread-Spectrum EMI and Digital Data Links under Narrowband Resonant Coupling

Crovetti

Musolino

2020

Electronics

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“…Figure 10c,d show the distribution of the voltage planes ( Figure 10d) and ground planes (Figure 10c). All of the PCB layers of the control and measurement system were designed in accordance with good engineering practices [38,39]. The project took into account the impact of the control algorithms on the level of electromagnetic interference [40] and the influence of magnetic materials [41].…”

Section: The Layout Of the Microacalorimetry Control And Measurement mentioning

confidence: 99%

A High-Resolution Measurement System Designed for Semiconductor Microcalorimetry Sensors

et al. 2019

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The quality of measurements of non-electrical quantities not only depends on the sensor but also on the electronic system that is used for the conversion of the electrical signals to a digital form. Many research papers on the subject analyse the properties and characteristics of the sensors in detail but omit the properties of the instruments that are used to measure the characteristics. This paper concentrates on the problems concerning the design of an instrument for generating control signals and measuring the output signals of a semiconductor sensor. The measurement instrument is designed for a commercial heat flow microcalorimeter that is able to measure heat flows at the level of several µW. The novelty of this paper is the analysis of some of the undocumented properties of the sensor and the interactions between its components. The design of the instrument makes it possible to correctly measure the output signals of a microcalorimeter without the influence of the described effects. The added value of this paper is a detailed analysis of the resolution of the system and the factors that may affect it. The remarks contained in the paper can be useful for designers of other instruments that are designed for measuring non-electrical quantities.

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“…As the foundation of the modern information industry, PCB is widely used in various high-end equipment manufacturing fields such as computers, communication electronic equipment and military systems [1,2]. As an important carrier of electrical connection and support, the quality of PCB has great influence on the stability and safety of various high-end equipment products [3]. Therefore, it is particularly important to study the highquality detection of PCB surface defects and to eliminate them in time.…”

Section: Introductionmentioning

confidence: 99%

Few-Shot PCB Surface Defect Detection Based on Feature Enhancement and Multi-Scale Fusion

2022

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In printed circuit board (PCB) defect detection, it is difficult to collect defect samples, and the detection effect is poor due to the lack of data. On the basis of the few-shot learning method, a few-shot PCB defect detection model is proposed. This model introduces feature enhancement module and multiscale fusion module. The feature enhancement module based on the improved convolution block attention module (CBAM) can highlight the key areas of the received feature maps and suppress the interference of useless information. Aiming at the small size of PCB defects, a multi-scale feature fusion strategy is proposed. It can extract multi-scale feature maps of PCB and fuse them into a high-quality feature map containing different scale information, which can improve the detection precision of the model for small object defects. A large number of experiments on PCB dataset show that our few-shot PCB defect detection model outperforms state-of-the-art methods under different shot settings (k=1,2,3,5,10,30). Notably, the proposed model can take into account both detection efficiency and precision, which means it has high practical application value.INDEX TERMS PCB defect detection, few-shot learning, feature enhancement, multi-scale fusion.

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Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit Board

Cited by 15 publications

References 13 publications

Interference of Spread-Spectrum EMI and Digital Data Links under Narrowband Resonant Coupling

Interference of Spread-Spectrum EMI and Digital Data Links under Narrowband Resonant Coupling

A High-Resolution Measurement System Designed for Semiconductor Microcalorimetry Sensors

Few-Shot PCB Surface Defect Detection Based on Feature Enhancement and Multi-Scale Fusion

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