“…Statistical multichannel deconvolution approaches such as Wiener filtering [2], [9], or Bayesian methods [10], [11] require prior information about the input signal, which may be difficult to obtain in practice, especially in a case such as electron microscopy in which a prototype image is not available. Without the correct signal statistics, the use of statistical methods can result in a distorted signal estimate [1], [11], [12]. In addition, the exact amount of noise reduction achieved in the postprocessing must be known for the statistical methods if significant smoothing is to be avoided.…”