The
coherent developments of high performance broadband photodetection
and a discrimination technique are highly essential for multiscene
imaging and optical communication applications. The integration of
traditional bandpass filters or stacking other spectral absorber in
photodetectors often complicates the device design and leads to asymmetric
photogain for each waveband. Herein, we report on ultraviolet–visible
(UV-vis) multispectral photodetection based on a single ZnO nanowire
(NW) phototransistor, where defect reconstructions can be reliably
induced by a two-step annealing that leads to the observed broadband
photodetection. Electron paramagnetic resonance and photoluminescence
spectra reveal the reconstructions of zinc-atom-related defects (i.e.,
zinc interstitials and vacancies). Combined microdifferential reflectance
and multimode scanning probe microscope (SPM) technique confirm the
presence of a unique visible-sensitive Zn-rich ZnO shell layer and
a trap-free UV-sensitive ZnO core. We achieve not only an ultrahigh
carrier mobility (212.4 cm2 V–1 s–1), but also a concurrent improvement for UV-vis photodetection
with superior responsivities and detectivities on the orders of 105 AW–1 and 1015 Jones at 100 mV,
respectively, and response speeds less than one second. Moreover,
photocurrents under blue, green, and red stimuli can be selectively
switched on/off by tuning the gate stress. These high performances
in all figures of merit have opened new routes to tailor intrinsic
properties of a single NW for optoelectronic applications.