2021
DOI: 10.1002/adpr.202000095
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Series Photothermoelectric Coupling Between Two Composite Materials for a Freely Attachable Broadband Imaging Sheet

Abstract: As flexible wearable sensors and imagers are receiving attention from diverse social sectors, the freely attachable photothermoelectric (PTE) conversion technique should be evaluated to develop a highly usable safety sensor network. Although carbon nanotube (CNT)‐related materials should be effective, the key parameters/structures that maximize PTE conversion have not been clarified, thus hindering optimum device design and practical use. Herein, the flexible, sensitive broadband photodetection operation based… Show more

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Cited by 16 publications
(34 citation statements)
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“…Figure shows a series configuration containing a p‐type CNT film channel connected to a counter metal electrode with a highly negative Seebeck coefficient to maximize the PTE response. [ 106 ] A ten‐fold sensitivity enhancement and an uncooled nonvacuum NEP of 30 pW Hz −1/2 at 1 THz are observed, which is at a similar level to the existing room‐temperature direct THz detectors. [ 30 ]…”
Section: Thz Detectors Based On Thermal Effectsupporting
confidence: 56%
See 1 more Smart Citation
“…Figure shows a series configuration containing a p‐type CNT film channel connected to a counter metal electrode with a highly negative Seebeck coefficient to maximize the PTE response. [ 106 ] A ten‐fold sensitivity enhancement and an uncooled nonvacuum NEP of 30 pW Hz −1/2 at 1 THz are observed, which is at a similar level to the existing room‐temperature direct THz detectors. [ 30 ]…”
Section: Thz Detectors Based On Thermal Effectsupporting
confidence: 56%
“…[ 105 ] Typically, first a CNT solution is filtered through a pre‐patterned polyimide film to form a bridged structure, and the CNT film is connected with the pre‐evaporated Bi electrode in series. The large negative Seebeck coefficient of Bi (−77 µV K −1 ) acts as a counter to that of the p ‐type CNT film (52 µV K −1 ) in the series CNT‐metal contact model, [ 106 ] and can thus ensure enhanced THz response. Then, the Au electrode in parallel connection and bit line electrodes are evaporated to form the detector elements (Figure 9b).…”
Section: Thz Detectors Based On Thermal Effectmentioning
confidence: 99%
“…The change in device resistance governs the noise voltage in photo-responses, and the signal intensity of photo-responses is attributed to the effective Seebeck coefficient at the photo-detection interface and photo-induced thermal gradient across the channel. Owing to the zero-bias voltage operation of CNT film PTE sensors ( 27 ), the device noise voltage can be approximated to the theoretical lower limit of the thermal noise (the “Noise equivalent power evaluation” section in Materials and Methods describes the corresponding details). While the intensity of noise voltages is proportional to R −1 , the device noise was suppressed to several tens of nanovolts even for stretched configurations, as shown in fig.…”
Section: Resultsmentioning
confidence: 99%
“…Based on the above device material considerations, this and the following chapter summarize the representative CNT-film-based PTE conversion: mechanism modeling, design strategies, and fundamental performances [ 24 , 25 , 26 ]. As thermoelectric conversion often employs the Seebeck effect at heterogeneous material junctions (typically P-type and N-type materials) to enhance the effective Seebeck coefficients, there are mainly two types of device structures for the CNT film PTE sensor.…”
Section: Pte Effect In Channel–electrode Junctionsmentioning
confidence: 99%
“…As thermoelectric conversion often employs the Seebeck effect at heterogeneous material junctions (typically P-type and N-type materials) to enhance the effective Seebeck coefficients, there are mainly two types of device structures for the CNT film PTE sensor. One is a CNT film channel–metal electrode boundary structure [ 24 ] and the other is a PN-junction-channel structure [ 25 ]. This chapter introduces the former type.…”
Section: Pte Effect In Channel–electrode Junctionsmentioning
confidence: 99%