Shading in TXRF: calculations and experimental validation using a color X-ray camera

Menzel, Magnus; Scharf, Oliver; Nowak, S.; Radtke, Martin; Reinholz, Uwe; Hischenhuber, Peter; Buzanich, Günter; Meyer, Andreas; Lopez, Velma; McIntosh, Kathryn; Streli, Christina; Havrilla, George J.; Fittschen, Ursula E. A.

doi:10.1039/c5ja00127g

Cited by 22 publications

(13 citation statements)

References 27 publications

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“…However, these techniques require the preparation of special equipment such as a pico-droplet inkjet printer or nano-droplet dispensing device to obtain nano-pico droplets. A strong shading effect for normal residue made from µL droplets in TXRF has been reported by a study using a color X-ray camera (CXC) [6]. 2D distribution of XRF signals from nano droplets was obtained by the CXC under total reflection conditions.…”

Section: Introductionmentioning

confidence: 90%

Sample preparation for total reflection X-ray fluorescence analysis using resist pattern technique

Tsuji

Yomogita

Konyuba

2018

Spectrochimica Acta Part B: Atomic Spectroscopy

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A circular resist pattern layer with a diameter of 9 mm was prepared on a glass substrate (26 mm x 76 mm; 1.5 mm thick) for total reflection X-ray fluorescence (TXRF) analysis. The parallel cross pattern was designed with a wall thickness of 10 µm, an interval of 20 µm, and a height of 1.4 or 0.8 µm. This additional resist layer did not significantly increase background intensity on the XRF peaks in TXRF spectra. Dotted residue was obtained from a standard solution (10 µL) containing Ti, Cr, Ni, Pb, and Ga, each at a final concentration of 10 ppm, on a normal glass substrate with a silicone coating layer. The height of the residue was more than 100 µm, where self-absorption in the large residue affected TXRF quantification (intensity relative standard deviation (RSD): 12-20%). In contrast, from a droplet composed of a small volume of solution dropped and cast on the resist pattern structure, the obtained residue was not completely film but a film-like residue with a thickness less than 1 µm, where self-absorption was not a serious problem. In the end, this sample preparation was demonstrated to improve TXRF quantification (intensity RSD: 2-4%).

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Section: Introductionmentioning

confidence: 90%

Sample preparation for total reflection X-ray fluorescence analysis using resist pattern technique

Tsuji

Yomogita

Konyuba

2018

Spectrochimica Acta Part B: Atomic Spectroscopy

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“…Later a 2 μL of a droplet of Ga at 5 μg/mL was added directly over to the sample holder. The very-small volumes of the droplets were chosen in order to reduce effects over the morphology of the sample [35] and effects over the excitation source [36]. We replicated the methodology previously applied for Cobalt evaluation in injectable multivitamins [37], obtaining in this case uncertainties in the order of 10%.…”

Section: Sample Preparationmentioning

confidence: 99%

Elemental Quantification in Intradermal Tattoo-Inks by Means of Total Reflection X-Ray Fluorescence

Riffo¹,

Ramírez-Lama²,

Bennun³

2020

JCDSA

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This work describes the application of a detailed set of TXRF evaluations to the elemental content of assorted tattoo inks, on the market of the city of Concepcion, Chile. We applied TXRF as a screening method for determining the composition in 3 sets of tattoo inks, in order to establish, from an inorganic point of view, the composition and purity of the samples, evaluating their elemental innocuousness. The analyzed 48 products were freely acquired from on line suppliers. All of them were analyzed by external standard quantification, but in order to inter-compare the results, a 15% of the samples were acidly digested and then quantified by the internal standard method. In the samples we determined: 1) their inorganic quantitative composition and, 2) the possible presence of elements which are potential health hazards. In this study few anomalies were found: 1) The high presence Ti of and W in few samples, 2) Arsenic was found in four of them, and 3) A trace detection of a rare earth element in a particular product. The products studied are almost freely imported from a world open marked, so the questions about their innocuousness could affect not only to the Chilean society.

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“…A re-drying process can cause recrystallization processes which mainly occur at places already enriched in this specific element, causing a non-uniformity across the sample affecting the accuracy of a quantitative analysis. The evaporation behavior of different kinds of droplets and studies on their morphology and homogeneity once dried have been studied and reported elsewhere [7,[39][40][41]. In TXRF, the superposition or interference between the incoming and reflected beams at small grazing incidence angles can cause X-ray standing waves above and below the substrates.…”

Section: Accepted M Manuscriptmentioning

confidence: 99%

Practical guidelines for best practice on Total Reflection X-ray Fluorescence spectroscopy: Analysis of aqueous solutions

Riaño

Regadío

Binnemans

et al. 2016

Spectrochimica Acta Part B: Atomic Spectroscopy

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Shading in TXRF: calculations and experimental validation using a color X-ray camera

Abstract: Absorption effects in total reflection X-ray fluorescence (TXRF) analysis are important to consider, especially if external calibration is to be applied.

Cited by 22 publications

References 27 publications

Sample preparation for total reflection X-ray fluorescence analysis using resist pattern technique

Sample preparation for total reflection X-ray fluorescence analysis using resist pattern technique

Elemental Quantification in Intradermal Tattoo-Inks by Means of Total Reflection X-Ray Fluorescence

Practical guidelines for best practice on Total Reflection X-ray Fluorescence spectroscopy: Analysis of aqueous solutions

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