2009
DOI: 10.1002/crat.200900495
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Shallow trapping center parameters in as‐grown AgIn5S8 crystals determined by thermally stimulated current measurements

Abstract: Thermally stimulated current measurements were carried out on as-grown AgIn 5 S 8 single crystals. The investigations were performed in temperatures ranging from 10 to 70 K with heating rate of 0.2 K/s. The analysis of the data revealed the electron trap level located at 5 meV. The activation energies of the traps have been determined using various methods of analysis, and they agree with each other. The calculation for these traps yielded 2.2 × 10 -25 cm 2 for capture cross section and 6.1 × 10 12 cm -3 for t… Show more

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Cited by 7 publications
(1 citation statement)
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“…A lot of methods, such as pulsed laser deposition, hot-press method, single crystal thermal evaporation and chemical bath deposition have been selected to prepare AgIn 5 S 8 [22,[27][28][29][30][31][32][33][34]. However, the procedures are relatively complicated and the apparatus used is expensive.…”
Section: Introductionmentioning
confidence: 99%
“…A lot of methods, such as pulsed laser deposition, hot-press method, single crystal thermal evaporation and chemical bath deposition have been selected to prepare AgIn 5 S 8 [22,[27][28][29][30][31][32][33][34]. However, the procedures are relatively complicated and the apparatus used is expensive.…”
Section: Introductionmentioning
confidence: 99%