As shown in Figure 1b-d, the SOT-MTJ devices were lithographically patterned from sputter-deposited multilayer stacks consisting of Si/SiO 2 /Ta 1/Au 0.25 Pt 0.75 5/Hf 0.5/ Fe 0.6 Co 0.2 B 0.2Many key electronic technologies (e.g., large-scale computing, machine learning, and superconducting electronics) require new memories that are at the same time fast, reliable, energy-efficient, and of low-impedance, which has remained a challenge. Nonvolatile magnetoresistive random access memories (MRAMs) driven by spin-orbit torques (SOTs) have promise to be faster and more energy-efficient than conventional semiconductor and spin-transfer-torque magnetic memories. It is reported that the spin Hall effect of low-resistivity Au 0.25 Pt 0.75 thin films enables ultrafast antidamping-torque switching of SOT-MRAM devices for current pulse widths as short as 200 ps. If combined with industrial-quality lithography and already-demonstrated interfacial engineering, an optimized MRAM cell based on Au 0.25 Pt 0.75 can have energy-efficient, ultrafast, and reliable switching, for example, a write energy of <1 fJ (<50 fJ) for write error rate of 50% (<10 −5 ) for 1 ns pulses. The antidamping torque switching of the Au 0.25 Pt 0.75 devices is ten times faster than expected from a rigid macrospin model, most likely because of the fast micromagnetics due to the enhanced nonuniformity within the free layer. The feasibility of Au 0.25 Pt 0.75 -based SOT-MRAMs as a candidate for ultrafast, reliable, energy-efficient, low-impedance, and unlimited-endurance memory is demonstrated.