2018
DOI: 10.1038/s41467-018-03003-7
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Shape anisotropy revisited in single-digit nanometer magnetic tunnel junctions

Abstract: Nanoscale magnetic tunnel junctions play a pivotal role in magnetoresistive random access memories. Successful implementation depends on a simultaneous achievement of low switching current for the magnetization switching by spin transfer torque and high thermal stability, along with a continuous reduction of junction size. Perpendicular easy-axis CoFeB/MgO stacks possessing interfacial anisotropy have paved the way down to 20-nm scale, below which a new approach needs to be explored. Here we show magnetic tunn… Show more

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Cited by 167 publications
(113 citation statements)
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References 43 publications
(53 reference statements)
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“…Overall, MgO spintronics represents a compelling route. Indeed, it benefits from both industrial penetration 54,61 and knowledge on how oxygen vacancies craft the spintronic nanotransport path [21][22][23][24]53 , boasts lateral sizes down to 4.3 nm 62 , and has been conjugated with half-metallic electrodes operating at RT 17 . PM centers can be formed in MgO by trapping C, N or Si on oxygen vacancies (see Fig.…”
Section: Discussionmentioning
confidence: 99%
“…Overall, MgO spintronics represents a compelling route. Indeed, it benefits from both industrial penetration 54,61 and knowledge on how oxygen vacancies craft the spintronic nanotransport path [21][22][23][24]53 , boasts lateral sizes down to 4.3 nm 62 , and has been conjugated with half-metallic electrodes operating at RT 17 . PM centers can be formed in MgO by trapping C, N or Si on oxygen vacancies (see Fig.…”
Section: Discussionmentioning
confidence: 99%
“…random access memory (MRAM) with large perpendicular magnetic anisotropy is attractive for its good scalability and high thermal stability [4,5] during fast sub-nanosecond write, [6] the required high write current density can exert severe stress on the magnetic tunnel junction (MTJ) and induce wear-out and breakdown of the MTJ barrier, [7] leading ultimately to degradation of the memory cell. Meanwhile, the shared read/write path can lead to write upon read errors.…”
Section: Energy-efficient Ultrafast Sot-mrams Based Onmentioning
confidence: 99%
“…As expected, read disturbance increases with read voltage and temperature. Thicker free layer thickness also increases read disturbance because of the reduced perpendicular magnetic anisotropy and hence thermal stability [44]. Fortunately, MeRAM is free from read disturbance because its read current direction is opposite to the direction that can switch the MTJ.…”
Section: Write Error and Read Disturbance Rate Under Variationmentioning
confidence: 99%