Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard

Abstract

This paper proposes a framework to help designers understand how to integrate customized Design for Test features under the guidelines of the 1149.1 standard. The paper begins by discussing the reasoning behind some of the essential features of the IEEE 1149.

A unified DFT architecture for use with IEEE 1149.1 and VSIA/IEEE P1500 compliant test access controllers

“…IEEE P1500 Standard for Embedded Core Test (SECT) has been proposed [1,2,3] as a standard for testing IP (Intellectual Property) cores in a SoC (System on a Chip) environment. To this end, the IEEE P1500 Working Group was formed in 1995.…”

“…Despite their many common features, there are certain differences between the VSIA and P1500 proposals. Basic concepts in both architectures are derived from the IEEE 1149.1 standard (including work done by the IEEE P1149.2 WG [6,7]). However, both solutions are incomplete in terms of providing a selfcontained methodology for use under the IEEE 1149.1 framework.…”