2014
DOI: 10.1002/best.201400007
|View full text |Cite
|
Sign up to set email alerts
|

Shewhart‐ und CUSUM‐Kontrollkarten zur gleichzeitigen Prozesssteuerung und Konformitätsbewertung

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
5

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(2 citation statements)
references
References 4 publications
0
2
0
Order By: Relevance
“…A so called V-mask helps to assess whether trending curves show critical trends or not [14][15][16]. It ideally provides very clear decision rules whether counteractions must be taken or not.…”
Section: Cmss-2017mentioning
confidence: 99%
See 1 more Smart Citation
“…A so called V-mask helps to assess whether trending curves show critical trends or not [14][15][16]. It ideally provides very clear decision rules whether counteractions must be taken or not.…”
Section: Cmss-2017mentioning
confidence: 99%
“…Caspeele and Taerwe proved that depending upon the parameters of the V-mask both conformity control and quality control can be achieved, but a tailoring of the V-mask to the production target value is required [16]. However, these recommendations were not considered in EN 206, so that the recommended standard method of EN 206 is not a feasible tool for process optimization [14,24].…”
Section: Cusum Process Control In Concrete Technologymentioning
confidence: 99%