2012
DOI: 10.1039/c2nr30910f
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Si nanotubes and nanospheres with two-dimensional polycrystalline walls

Abstract: We report on the characteristics of a new class of Si-based nanotubes and spherical nanoparticles synthesized by the dc-arc plasma method in a mixture of argon and hydrogen. These two nanostructures share common properties: they are hollow and possess very thin, highly polycrystalline and mainly oxidized walls. In particular, we get several hints indicating that their walls could constitute only one single Si oxidized layer. Moreover, we find that only the less oxidized nanotubes exhibit locally atomic ordered… Show more

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Cited by 14 publications
(12 citation statements)
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“…26 All the nanotubes were seen to consist of very thin walls (<1 nm, $0.7 nm) and were composed of single Si partially oxidized layer. 3 However, there were less oxidized and unoxidized regions on the nanotubes that exhibited local atomic ordering with hexagonal puckered Si(111) type arrangements. 3 The two dimensional lattice constant in these regions was found to be 0.43 6 0.05 nm, from which the Si-Si distance can be estimated to be 0.25 6 0.03 nm 3 .…”
Section: Resultsmentioning
confidence: 99%
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“…26 All the nanotubes were seen to consist of very thin walls (<1 nm, $0.7 nm) and were composed of single Si partially oxidized layer. 3 However, there were less oxidized and unoxidized regions on the nanotubes that exhibited local atomic ordering with hexagonal puckered Si(111) type arrangements. 3 The two dimensional lattice constant in these regions was found to be 0.43 6 0.05 nm, from which the Si-Si distance can be estimated to be 0.25 6 0.03 nm 3 .…”
Section: Resultsmentioning
confidence: 99%
“…3 However, there were less oxidized and unoxidized regions on the nanotubes that exhibited local atomic ordering with hexagonal puckered Si(111) type arrangements. 3 The two dimensional lattice constant in these regions was found to be 0.43 6 0.05 nm, from which the Si-Si distance can be estimated to be 0.25 6 0.03 nm 3 . These properties were observed by nanobeam electron energy loss spectroscopy, nanobeam electron diffraction, and high resolution TEM earlier.…”
Section: Resultsmentioning
confidence: 99%
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