SigmaCalc recent development and present status of the evaluated cross-sections for IBA

Gurbich, A.F.

doi:10.1016/j.nimb.2015.09.035

Cited by 140 publications

(79 citation statements)

References 24 publications

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“…The reaction cross-section for the 14 N(d,a 1 ) 12 C reaction at a deuteron energy of 1.2 MeV is around 2 mb sr À1 (ref. 36) whereas that for the 14 N(a,a) 14 N reaction at an alpha energy of 3.7 MeV is up to 140 mb sr À1 . Of course, there is no background for the NRA, but even so the time needed for reasonable statistics is longer for NRA because of the low cross-section.…”

Section: Analysis Overviewmentioning

confidence: 91%

Quantifying nitrogen in GeSbTe:N alloys

Jeynes

Nolot

Costa

et al. 2020

J. Anal. At. Spectrom.

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Section: Analysis Overviewmentioning

confidence: 91%

Quantifying nitrogen in GeSbTe:N alloys

Jeynes

Nolot

Costa

et al. 2020

J. Anal. At. Spectrom.

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“…We will show that the beam energy can be determined at remarkably good precision, and an accuracy (estimated by a full uncertainty budget) that is dominated by the accuracy with which the resonance energy is known. We will show that from evaluating the literature that this resonance energy is at 3038.2 ± 3.1 keV, and SigmaCalc-v2.0 [6] has been adjusted to give this value.…”

Section: Introductionmentioning

confidence: 99%

On the traceably accurate voltage calibration of electrostatic accelerators

Colaux

Terwagne

Jeynes

2015

Nuclear Instruments and Methods in Physics Research Section B:

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“…What has changed in this century is the steady increase in the availability of "evaluated" cross-section functions, now available on the "SigmaCalc" website (http://sigmacalc.iate. obnisk.ru/) 125 . Since there already exists a very well articulated theory of nuclear interactions it is "straightforward" (for skilled nuclear physicists!)…”

Section: Evaluated Elastic Backscattering (Ebs) Cross-sectionsmentioning

confidence: 99%

Thin film depth profiling by ion beam analysis

Jeynes

Colaux

2016

Analyst

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The analysis of thin films is of central importance for functional materials, including the very large and active field of nanomaterials. Quantitative elemental depth profiling is basic to analysis, and many techniques exist, but all have limitations and quantitation is always an issue. We here review recent significant advances in ion beam analysis (IBA) which now merit it a standard place in the analyst's toolbox. Rutherford backscattering spectrometry (RBS) has been in use for half a century to obtain elemental depth profiles non-destructively from the first fraction of a micron from the surface of materials: more generally, "IBA" refers to the cluster of methods including elastic scattering (RBS; elastic recoil detection, ERD; and non-Rutherford elastic backscattering, EBS), nuclear reaction analysis (NRA: including particle-induced gamma-ray emission, PIGE), and also particle-induced X-ray emission (PIXE). We have at last demonstrated what was long promised, that RBS can be used as a primary reference technique for the best traceable accuracy available for non-destructive model-free methods in thin films. Also, it has become clear over the last decade that we can effectively combine synergistically the quite different information available from the atomic (PIXE) and nuclear (RBS, EBS, ERD, NRA) methods. Although it is well known that RBS has severe limitations that curtail its usefulness for elemental depth profiling, these limitations are largely overcome when we make proper synergistic use of IBA methods. In this Tutorial Review we aim to briefly explain to analysts what IBA is and why it is now a general quantitative method of great power. Analysts have got used to the availability of the large synchrotron facilities for certain sorts of difficult problems, but there are many much more easily accessible mid-range IBA facilities also able to address (and often more quantitatively) a wide range of otherwise almost intractable thin film questions.

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SigmaCalc recent development and present status of the evaluated cross-sections for IBA

Cited by 140 publications

References 24 publications

Quantifying nitrogen in GeSbTe:N alloys

Quantifying nitrogen in GeSbTe:N alloys

On the traceably accurate voltage calibration of electrostatic accelerators

Thin film depth profiling by ion beam analysis

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