Signal Photoelectron Yield Dependence on the X-Ray Angle of Incidence

Tilinin, I.S.; Jabłoński, A.; Lesiak-Orlowska, B.

doi:10.12693/aphyspola.86.853

Cited by 3 publications

(4 citation statements)

References 7 publications

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“…As seen in literature 29 and discussed earlier, the surface Mn valence is smaller than þ3.3. Another exponential term is added to Equation (1) to better represent the depth dependent Mn valence…”

supporting

confidence: 58%

“…¼ 1.0 nm, consistent with the electron mean free path in LSMO. 29 The best fit gave surface, interface, and bulk valences of V surf % 2.0, V int % 2.52, and V bulk % 3.36. The best fit curves are shown in short dashed pink in Figs.…”

mentioning

confidence: 96%

“…Because the incident x-rays at the Mn K-edge are ten times more energetic than those at the Mn L-edge and the escape depth of FL photons is drastically larger than that of electrons, FL at Mn K-edge detects significantly deeper than TEY measurements at Mn L-edge. 28 For a rough estimation, the electron mean free path 29 predominantly determines the TEY attenuation length. The reported mean free path for Mn 3s electrons was about 0.5 to 1.8 nm at Mn L-edge energies.…”

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confidence: 99%

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Thickness dependence of La0.7Sr0.3MnO3/PbZr0.2Ti0.8O3 magnetoelectric interfaces

Zhou

Tra

Dong

et al. 2015

Applied Physics Letters

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Magnetoelectric materials have great potential to revolutionize electronic devices due to the coupling of their electric and magnetic properties. Thickness varying La 0.7 Sr 0.3 MnO 3 (LSMO)/ PbZr 0.2 Ti 0.8 O 3 (PZT) heterostructures were built and measured in this article by valence sensitive x-ray absorption spectroscopy. The sizing effects of the heterostructures on the LSMO/PZT magnetoelectric interfaces were investigated through the behavior of Mn valence, a property associated with the LSMO magnetization. We found that Mn valence increases with both LSMO and PZT thickness. Piezoresponse force microscopy revealed a transition from monodomain to polydomain structure along the PZT thickness gradient. The ferroelectric surface charge may change with domain structure and its effects on Mn valence were simulated using a two-orbital double-exchange model. The screening of ferroelectric surface charge increases the electron charges in the interface region, and greatly changes the interfacial Mn valence, which likely plays a leading role in the interfacial magnetoelectric coupling. The LSMO thickness dependence was examined through the combination of two detection modes with drastically different attenuation depths. The different length scales of these techniques' sensitivity to the atomic valence were used to estimate the depth dependence Mn valence. A smaller interfacial Mn valence than the bulk was found by globally fitting the experimental results. V C 2015 AIP Publishing LLC.

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supporting

confidence: 58%

mentioning

confidence: 96%

mentioning

confidence: 99%

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Thickness dependence of La0.7Sr0.3MnO3/PbZr0.2Ti0.8O3 magnetoelectric interfaces

Zhou

Tra

Dong

et al. 2015

Applied Physics Letters

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“…4,[17][18][19][20][21][22] It was found that the transport approximation predictions for different emission characteristics were astonishingly accurate, even in the intermediate case of scattering parameters, i ϳ tr , which is of the most relevance for XPS. The discrepancies between the Monte Carlo and analytical results, as a rule, do not exceed several percent as regards the angular and energy spectrum of emitted electrons, 19,20 the emission depth and the traveled pathlength distributions, 17,21 the mean escape depth, 4 the total photoelectron yield, 22 and so on. In view of this it seems appropriate to apply the transport approximation to the problem of signal photoelectron emission by polarized x rays.…”

Section: Solution Of Transport Problemmentioning

confidence: 99%

Mean escape depth of signal photoelectrons ejected from solids by polarized x rays

Tilinin

1996

Phys. Rev. B

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Quick development of synchrotron radiation facilities and prospective applications of photon beams of a variable energy in spectroscopy of solids and interfaces prompts further studies of photoemission induced by polarized soft x rays. One of the most important characteristics in surface sensitive spectroscopies is the mean escape depth of signal electrons leaving a sample without being scattered inelastically. In this article a simple analytical expression for the average escape depth of photoelectrons ejected by polarized x rays is found by means of the depth distribution function obtained by solving the transport equation. The dependence of the escape depth on the type and the degree of photon polarization is predicted. This effect is due to the anisotropy of the initial angular distribution of photoelectrons and elastic scattering they suffer on their way out of the target. The variation of the mean escape depth with the type and the degree of polarization as well as with the emission direction from the target is quite well pronounced and may reach up to 100% with respect to the value determined by the inelastic mean free path in the usual x-ray photoelectron spectroscopy formalism. The dependence of the escape depth on the azimuthal and polar emission angles is studied in detail. In the special case of unpolarized x rays the expression for the average escape depth reduces to the result found earlier.

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