2011
DOI: 10.1063/1.3536674
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Signal-to-noise ratio in dual-gated silicon nanoribbon field-effect sensors

Abstract: Recent studies on nanoscale field-effect sensors reveal the crucial importance of the low frequency noise for determining the ultimate detection limit. In this letter, the 1/f -type noise of Si nanoribbon field-effect sensors is investigated. We demonstrate that the signal-to-noise ratio can be increased by almost two orders of magnitude if the nanoribbon is operated in an optimal gate voltage range. In this case, the additional noise contribution from the contact regions is minimized, and an accuracy of 0.5 ‰… Show more

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Cited by 53 publications
(58 citation statements)
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“…The SNR (defined per volt change in surface potential) is therefore independent of the actual change in surface potential and intrinsic to the device as our results indicate, which means that we can safely define and use this figure-of-merit to predict the detection limit of these bioFET sensors. We also observe that SNR for our devices is maximized in the linear regime, close to the peak transconductance (g m,peak ), which is contrary to what was observed in other works, 15,16 where SNR was determined to be maximum in subthreshold. The difference in the operating regime at which maximum SNR occurs can be explained by different mobility fluctuation noise regimes 13 (potentially caused by different material systems used, by different gate configurations, or by contact resistance dominated regimes).…”
contrasting
confidence: 54%
“…The SNR (defined per volt change in surface potential) is therefore independent of the actual change in surface potential and intrinsic to the device as our results indicate, which means that we can safely define and use this figure-of-merit to predict the detection limit of these bioFET sensors. We also observe that SNR for our devices is maximized in the linear regime, close to the peak transconductance (g m,peak ), which is contrary to what was observed in other works, 15,16 where SNR was determined to be maximum in subthreshold. The difference in the operating regime at which maximum SNR occurs can be explained by different mobility fluctuation noise regimes 13 (potentially caused by different material systems used, by different gate configurations, or by contact resistance dominated regimes).…”
contrasting
confidence: 54%
“…Note that studies on the noise and sensitivity of this type of devices have been described in previous work. [29,31,32,33] …”
Section: Introductionmentioning
confidence: 99%
“…1(e), a schematic of the measurement setup is shown. (17,22) The device was operated at a source-drain voltage V sd of 0.1 V and the conductance G through the device was measured. The conductance was modulated by a top liquid gate voltage V lg that was applied to a platinum wire immersed in the buffer solution.…”
Section: Methodsmentioning
confidence: 99%